Yan Duval

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Beaconsfield, CA

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Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR OBJECT INSPECTION USING RELIEF DETERMINATION
- Publication number 20080117438
- Publication date May 22, 2008
- SOLVISION INC.
- Benoit Quirion
- G01 - MEASURING TESTING
Information Patent Application
3D and 2D measurement system and method with increased sensitivity...
- Publication number 20060109482
- Publication date May 25, 2006
- Yan Duval
- G01 - MEASURING TESTING