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Yan HE
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Fishkill, NY, US
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last 30 patents
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Patent Grant
Capacitive measurements of divots in semiconductor devices
Patent number
9,941,179
Issue date
Apr 10, 2018
GLOBALFOUNDRIES Inc.
Lyndon R. Logan
H01 - BASIC ELECTRIC ELEMENTS
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last 30 patents
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Patent Application
CAPACITIVE MEASUREMENTS OF DIVOTS IN SEMICONDUCTOR DEVICES
Publication number
20160370311
Publication date
Dec 22, 2016
International Business Machines Corporation
Lyndon R. LOGAN
G01 - MEASURING TESTING