Yan Hu

Person

Ventura, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus of operating a scanning probe microscope
- Patent number 11,002,757
- Issue date May 11, 2021
- Bruker Nano, Inc.
- Yan Hu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus of using peak force tapping mode to measure ph...
- Patent number 10,663,483
- Issue date May 26, 2020
- Bruker Nano, Inc.
- Chanmin Su
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus of operating a scanning probe microscope
- Patent number 10,502,761
- Issue date Dec 10, 2019
- Bruker Nano, Inc.
- Yan Hu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus of operating a scanning probe microscope
- Patent number 10,197,596
- Issue date Feb 5, 2019
- Bruker Nano, Inc.
- Jian Shi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus of using peak force tapping mode to measure ph...
- Patent number 9,995,765
- Issue date Jun 12, 2018
- Bruker Nano, Inc.
- Chanmin Su
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus of electrical property measurement using an AF...
- Patent number 9,869,694
- Issue date Jan 16, 2018
- Bruker Nano, Inc.
- Chunzeng Li
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus of operating a scanning probe microscope
- Patent number 9,810,713
- Issue date Nov 7, 2017
- Bruker Nano, Inc.
- Jian Shi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus of operating a scanning probe microscope
- Patent number 9,588,136
- Issue date Mar 7, 2017
- Bruker Nano, Inc.
- Yan Hu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus of operating a scanning probe microscope
- Patent number 9,322,842
- Issue date Apr 26, 2016
- Bruker Nano, Inc.
- Yan Hu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus of using peak force tapping mode to measure ph...
- Patent number 9,291,640
- Issue date Mar 22, 2016
- Bruker Nano, Inc.
- Chanmin Su
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus of operating a scanning probe microscope
- Patent number 9,274,139
- Issue date Mar 1, 2016
- Bruker Nano, Inc.
- Jian Shi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus of electrical property measurement using an AF...
- Patent number 9,213,047
- Issue date Dec 15, 2015
- Bruker Nano, Inc.
- Chunzeng Li
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus of operating a scanning probe microscope
- Patent number 8,739,309
- Issue date May 27, 2014
- Bruker Nano, Inc.
- Yan Hu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus of using peak force tapping mode to measure ph...
- Patent number 8,650,660
- Issue date Feb 11, 2014
- Bruker Nano, Inc.
- Jian Shi
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus of operating a scanning probe microscope
- Patent number 8,646,109
- Issue date Feb 4, 2014
- Bruker Nano, Inc.
- Yan Hu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and Apparatus of Operating a Scanning Probe Microscope
- Publication number 20200191826
- Publication date Jun 18, 2020
- Bruker Nano, Inc.
- Yan Hu
- B82 - NANO-TECHNOLOGY
Information Patent Application
Method and Apparatus of Using Peak Force Tapping Mode to Measure Ph...
- Publication number 20190018040
- Publication date Jan 17, 2019
- Bruker Nano, Inc.
- Chanmin Su
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus of Operating a Scanning Probe Microscope
- Publication number 20180136251
- Publication date May 17, 2018
- Bruker Nano, Inc.
- Jian Shi
- B82 - NANO-TECHNOLOGY
Information Patent Application
Method and Apparatus of Operating a Scanning Probe Microscope
- Publication number 20170242052
- Publication date Aug 24, 2017
- Bruker Nano, Inc.
- Yan Hu
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus of Operating a Scanning Probe Microscope
- Publication number 20160313367
- Publication date Oct 27, 2016
- Bruker Nano, Inc.
- Yan Hu
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus of Using Peak Force Tapping Mode to Measure Ph...
- Publication number 20160274144
- Publication date Sep 22, 2016
- Bruker Nano, Inc.
- Chanmin Su
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus of Operating a Scanning Probe Microscope
- Publication number 20160258979
- Publication date Sep 8, 2016
- Bruker Nano, Inc.
- Jian Shi
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus of Electrical Property Measurement Using an AF...
- Publication number 20160178659
- Publication date Jun 23, 2016
- Bruker Nano, Inc.
- Chunzeng Li
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus of Operating a Scanning Probe Microscope
- Publication number 20140283229
- Publication date Sep 18, 2014
- Bruker Nano, Inc.
- Yan Hu
- B82 - NANO-TECHNOLOGY
Information Patent Application
Method and Apparatus of Using Peak Force Tapping Mode to Measure Ph...
- Publication number 20140230103
- Publication date Aug 14, 2014
- Bruker Nano, Inc.
- Chanmin Su
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus of Operating a Scanning Probe Microscope
- Publication number 20140223615
- Publication date Aug 7, 2014
- Bruker Nano, Inc.
- Jian Shi
- B82 - NANO-TECHNOLOGY
Information Patent Application
Method and Apparatus of Electrical Property Measurement Using an AF...
- Publication number 20130276174
- Publication date Oct 17, 2013
- Chunzeng Li
- B82 - NANO-TECHNOLOGY
Information Patent Application
Method and Apparatus of Using Peak Force Tapping Mode to Measure Ph...
- Publication number 20120131702
- Publication date May 24, 2012
- Bruker Nano, Inc.
- Jian Shi
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS OF OPERATING A SCANNING PROBE MICROSCOPE
- Publication number 20110167524
- Publication date Jul 7, 2011
- Bruker Nano, Inc.
- Yan Hu
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS OF OPERATING A SCANNING PROBE MICROSCOPE
- Publication number 20100122385
- Publication date May 13, 2010
- VEECO INSTRUMENTS INC.
- Yan Hu
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Method and apparatus of operating a scanning probe microscope

Method and apparatus of using peak force tapping mode to measure ph...

Method and apparatus of operating a scanning probe microscope

Method and apparatus of operating a scanning probe microscope

Method and apparatus of using peak force tapping mode to measure ph...

Method and apparatus of electrical property measurement using an AF...

Method and apparatus of operating a scanning probe microscope

Method and apparatus of operating a scanning probe microscope

Method and apparatus of operating a scanning probe microscope

Method and apparatus of using peak force tapping mode to measure ph...

Method and apparatus of operating a scanning probe microscope

Method and apparatus of electrical property measurement using an AF...

Method and apparatus of operating a scanning probe microscope

Method and apparatus of using peak force tapping mode to measure ph...

Method and apparatus of operating a scanning probe microscope

Patents Applicationslast 30 patents

Method and Apparatus of Operating a Scanning Probe Microscope

Method and Apparatus of Using Peak Force Tapping Mode to Measure Ph...

Method and Apparatus of Operating a Scanning Probe Microscope

Method and Apparatus of Operating a Scanning Probe Microscope

Method and Apparatus of Operating a Scanning Probe Microscope

Method and Apparatus of Using Peak Force Tapping Mode to Measure Ph...

Method and Apparatus of Operating a Scanning Probe Microscope

Method and Apparatus of Electrical Property Measurement Using an AF...

Method and Apparatus of Operating a Scanning Probe Microscope

Method and Apparatus of Using Peak Force Tapping Mode to Measure Ph...

Method and Apparatus of Operating a Scanning Probe Microscope

Method and Apparatus of Electrical Property Measurement Using an AF...

Method and Apparatus of Using Peak Force Tapping Mode to Measure Ph...

METHOD AND APPARATUS OF OPERATING A SCANNING PROBE MICROSCOPE

METHOD AND APPARATUS OF OPERATING A SCANNING PROBE MICROSCOPE