Yan Ivanchenko

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Nes Ziona, IL

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Patents Grantslast 30 patents

Information Patent Grant
CD-SEM technique for wafers fabrication control
- Patent number 9,824,852
- Issue date Nov 21, 2017
- Applied Materials Israel Ltd.
- Roman Kris
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Registration of CAD data with SEM images
- Patent number 9,715,724
- Issue date Jul 25, 2017
- Applied Materials Israel Ltd.
- Ishai Schwarzband
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and methods for the detection of abnormal motion in a vid...
- Patent number 8,724,891
- Issue date May 13, 2014
- Ramot at Tel Aviv University Ltd.
- Nahum Kiryati
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
CD metrology system and method of classifying similar structural el...
- Patent number 8,538,130
- Issue date Sep 17, 2013
- Applied Materials Israel, Ltd.
- Yan Ivanchenko
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
CD-SEM TECHNIQUE FOR WAFERS FABRICATION CONTROL
- Publication number 20170194125
- Publication date Jul 6, 2017
- APPLIED MATERIALS ISRAEL LTD.
- Roman KRIS
- G01 - MEASURING TESTING
Information Patent Application
REGISTRATION OF CAD DATA WITH SEM IMAGES
- Publication number 20160035076
- Publication date Feb 4, 2016
- APPLIED MATERIALS ISRAEL LTD.
- Ishai SCHWARZBAND
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CD METROLOGY SYSTEM AND METHOD OF CLASSIFYING SIMILAR STRUCTURAL EL...
- Publication number 20120076393
- Publication date Mar 29, 2012
- Yan Ivanchenko
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Apparatus and methods for the detection of abnormal motion in a vid...
- Publication number 20060045185
- Publication date Mar 2, 2006
- RAMOT AT TEL-AVIV UNIVERSITY LTD.
- Nahum Kiryati
- G06 - COMPUTING CALCULATING COUNTING