Yan PAN

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Clifton Park, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Systematic defects inspection method with combined eBeam inspection...
- Patent number 10,234,500
- Issue date Mar 19, 2019
- GLOBALFOUNDRIES Inc.
- Weihong Gao
- G01 - MEASURING TESTING
Information Patent Grant
Early development of a database of fail signatures for systematic d...
- Patent number 10,191,112
- Issue date Jan 29, 2019
- GLOBALFOUNDRIES Inc.
- Rao Desineni
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
EARLY DEVELOPMENT OF A DATABASE OF FAIL SIGNATURES FOR SYSTEMATIC D...
- Publication number 20180143248
- Publication date May 24, 2018
- GLOBALFOUNDRIES INC.
- Rao Desineni
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMATIC DEFECTS INSPECTION METHOD WITH COMBINED EBEAM INSPECTION...
- Publication number 20160306009
- Publication date Oct 20, 2016
- GLOBALFOUNDRIES INC.
- Weihong GAO
- G01 - MEASURING TESTING