Yan REN

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Delft, NL

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for inspecting a sample using a plurality of c...
- Patent number 10,903,042
- Issue date Jan 26, 2021
- TECHNISCHE UNIVERSITEIT DELFT
- Pieter Kruit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for inspecting a sample using a plurality of c...
- Patent number 10,453,649
- Issue date Oct 22, 2019
- Technische Universiteit Delft
- Pieter Kruit
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for inspecting a surface of a sample
- Patent number 9,697,985
- Issue date Jul 4, 2017
- Technische Universiteit Delft
- Pieter Kruit
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Apparatus and method for inspecting a sample using a plurality of c...
- Publication number 20200035447
- Publication date Jan 30, 2020
- Technische Universiteit Delft
- Pieter KRUIT
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus and method for inspecting a sample using a plurality of c...
- Publication number 20170133198
- Publication date May 11, 2017
- Technische Universiteit Delft
- Pieter KRUIT
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus and method for inspecting a surface of a sample
- Publication number 20150179399
- Publication date Jun 25, 2015
- Technische Universiteit Delft
- Pieter Kruit
- H01 - BASIC ELECTRIC ELEMENTS