Yan REN

Person

Eindhoven, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for real time stereo imaging using multiple ele...
- Patent number 11,942,303
- Issue date Mar 26, 2024
- ASML Netherlands B.V.
- Yan Ren
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pulsed charged-particle beam system
- Patent number 11,942,302
- Issue date Mar 26, 2024
- ASML Netherlands B.V.
- Arno Jan Bleeker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for and method of controlling an energy spread of a charg...
- Patent number 11,881,374
- Issue date Jan 23, 2024
- ASML Netherlands B.V.
- Shakeeb Bin Hasan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for multiple charged-particle beams
- Patent number 11,804,355
- Issue date Oct 31, 2023
- ASML Netherlands B.V.
- Yan Ren
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CHARGED-PARTICLE OPTICAL APPARATUS AND PROJECTION METHOD
- Publication number 20240339294
- Publication date Oct 10, 2024
- ASML NETHERLANDS B.V.
- Marijke SCOTUZZI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE DEVICE, CHARGED PARTICLE ASSESSMENT APPARATUS, MEA...
- Publication number 20240339292
- Publication date Oct 10, 2024
- ASML NETHERLANDS B.V.
- Yan REN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED-PARTICLE APPARATUS, MULTI-DEVICE APPARATUS, METHOD OF USING...
- Publication number 20240331968
- Publication date Oct 3, 2024
- ASML NETHERLANDS B.V.
- Yan REN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE TOOL, CALIBRATION METHOD, INSPECTION METHOD
- Publication number 20230324318
- Publication date Oct 12, 2023
- ASML NETHERLANDS B.V.
- Yan REN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PULSED CHARGED-PARTICLE BEAM SYSTEM
- Publication number 20230154722
- Publication date May 18, 2023
- ASML NETHERLANDS B.V.
- Arno Jan BLEEKER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR REAL TIME STEREO IMAGING USING MULTIPLE ELE...
- Publication number 20230154723
- Publication date May 18, 2023
- ASML NETHERLANDS B.V.
- Yan REN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS FOR AND METHOD OF CONTROL OF A CHARGED PARTICLE BEAM
- Publication number 20230048580
- Publication date Feb 16, 2023
- ASML NETHERLANDS B.V.
- Albertus Victor Gerardus MANGNUS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR CHROMATIC ABERRATION MITIGATION
- Publication number 20230028084
- Publication date Jan 26, 2023
- ASML NETHERLANDS B.V.
- Yan REN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS FOR AND METHOD OF CONTROLLING AN ENERGY SPREAD OF A CHARG...
- Publication number 20220148842
- Publication date May 12, 2022
- ASML NETHERLANDS B.V.
- Shakeeb Bin HASAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS FOR MULTIPLE CHARGED-PARTICLE BEAMS
- Publication number 20220068587
- Publication date Mar 3, 2022
- ASML NETHERLANDS B.V.
- Yan REN
- H01 - BASIC ELECTRIC ELEMENTS

Person

Patents Grantslast 30 patents

Systems and methods for real time stereo imaging using multiple ele...

Pulsed charged-particle beam system

Apparatus for and method of controlling an energy spread of a charg...

Apparatus for multiple charged-particle beams

Patents Applicationslast 30 patents

CHARGED-PARTICLE OPTICAL APPARATUS AND PROJECTION METHOD

CHARGED PARTICLE DEVICE, CHARGED PARTICLE ASSESSMENT APPARATUS, MEA...

CHARGED-PARTICLE APPARATUS, MULTI-DEVICE APPARATUS, METHOD OF USING...

CHARGED PARTICLE TOOL, CALIBRATION METHOD, INSPECTION METHOD

PULSED CHARGED-PARTICLE BEAM SYSTEM

SYSTEMS AND METHODS FOR REAL TIME STEREO IMAGING USING MULTIPLE ELE...

APPARATUS FOR AND METHOD OF CONTROL OF A CHARGED PARTICLE BEAM

SYSTEMS AND METHODS FOR CHROMATIC ABERRATION MITIGATION

APPARATUS FOR AND METHOD OF CONTROLLING AN ENERGY SPREAD OF A CHARG...

APPARATUS FOR MULTIPLE CHARGED-PARTICLE BEAMS