Yan Sun

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Fremont, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Dark field wafer nano-defect inspection system with a singular beam
- Patent number 10,345,246
- Issue date Jul 9, 2019
- Tokyo Electron Limited
- Xinkang Tian
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHODS AND SYSTEMS FOR DISTRIBUTED MACHINE LEARNING BASED ANOMALY...
- Publication number 20240097999
- Publication date Mar 21, 2024
- Pensando Systems Inc.
- Yan Sun
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL SENSOR FOR REMOTE TEMPERATURE MEASUREMENTS
- Publication number 20230395408
- Publication date Dec 7, 2023
- TOKYO ELECTRON LIMITED
- Ivan MALEEV
- G01 - MEASURING TESTING