Yan-Wei Tien

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Hualien City, TW

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Patents Grantslast 30 patents

Information Patent Grant
Defect management systems and methods
- Patent number 9,269,135
- Issue date Feb 23, 2016
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yan-Wei Tien
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for defect analysis of a substrate
- Patent number 8,965,102
- Issue date Feb 24, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yan-Wei Tien
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR DEFECT ANALYSIS OF A SUBSTRATE
- Publication number 20140133736
- Publication date May 15, 2014
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yan-Wei Tien
- G01 - MEASURING TESTING
Information Patent Application
Defect Management Systems and Methods
- Publication number 20130231769
- Publication date Sep 5, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yan-Wei Tien
- G06 - COMPUTING CALCULATING COUNTING