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Yan Xiong
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Sunnyvale, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Defect detection using structural information
Patent number
9,727,047
Issue date
Aug 8, 2017
KLA-Tencor Corp.
Qing Luo
G05 - CONTROLLING REGULATING
Information
Patent Grant
Process excursion detection
Patent number
8,289,510
Issue date
Oct 16, 2012
KLA-Tencor Corporation
Patrick Y. Huet
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems for determining a defect criticality index for...
Patent number
8,139,844
Issue date
Mar 20, 2012
KLA-Tencor Corp.
Chien-Huei (Adam) Chen
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems for generating an inspection process for a wafer
Patent number
8,112,241
Issue date
Feb 7, 2012
KLA-Tencor Corp.
Yan Xiong
G01 - MEASURING TESTING
Information
Patent Grant
Process excursion detection
Patent number
7,646,476
Issue date
Jan 12, 2010
KLA-Tencor Corporation
Patrick Y. Huet
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Wafer inspection systems and methods for analyzing inspection data
Patent number
7,417,724
Issue date
Aug 26, 2008
KLA-Tencor Technologies Corp.
Paul Sullivan
G01 - MEASURING TESTING
Information
Patent Grant
Process excursion detection
Patent number
7,394,534
Issue date
Jul 1, 2008
KLA-Tencor Corporation
Patrick Y. Huet
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Processing scanned pages
Patent number
7,362,455
Issue date
Apr 22, 2008
Hewlett-Packard Development Company, L.P.
Yan Xiong
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Wafer inspection systems and methods for analyzing inspection data
Patent number
7,227,628
Issue date
Jun 5, 2007
KLA-Tencor Technologies Corp.
Paul Sullivan
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Defect Detection Using Structural Information
Publication number
20160104600
Publication date
Apr 14, 2016
KLA-Tencor Corporation
Qing Luo
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Process Excursion Detection
Publication number
20110137576
Publication date
Jun 9, 2011
KLA-Tencor Corporation
Patrick Y. Huet
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHODS AND SYSTEMS FOR GENERATING AN INSPECTION PROCESS FOR A WAFER
Publication number
20100235134
Publication date
Sep 16, 2010
KLA-Tencor Corporation
Yan Xiong
G01 - MEASURING TESTING
Information
Patent Application
Process Excursion Detection
Publication number
20100067781
Publication date
Mar 18, 2010
KLA-Tencor Corporation
Patrick Y. Huet
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHODS AND SYSTEMS FOR DETERMINING A DEFECT CRITICALITY INDEX FOR...
Publication number
20090257645
Publication date
Oct 15, 2009
Chien-Huei (Adam) Chen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Process Excursion Detection
Publication number
20080204739
Publication date
Aug 28, 2008
KLA-Tencor Corporation
Patrick Y. Huet
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Processing scanned pages
Publication number
20040119998
Publication date
Jun 24, 2004
Yan Xiong
G06 - COMPUTING CALCULATING COUNTING