YANG-HUNG CHENG

Follow

Person

ZHUBEI, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Vertical probe head
- Patent number 11,774,468
- Issue date Oct 3, 2023
- MPI Corporation
- Chin-Tien Yang
- G01 - MEASURING TESTING
Information Patent Grant
Adjustable probe device for impedance testing for circuit board
- Patent number 11,460,498
- Issue date Oct 4, 2022
- MPI Corporation
- Yang-Hung Cheng
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE CARD, METHOD FOR DESIGNING PROBE CARD, METHOD FOR PRODUCING T...
- Publication number 20240077519
- Publication date Mar 7, 2024
- MPI CORPORATION
- Yang-Hung Cheng
- G01 - MEASURING TESTING
Information Patent Application
VERTICAL PROBE HEAD
- Publication number 20230007997
- Publication date Jan 12, 2023
- MPI Corporation
- CHIN-TIEN YANG
- G01 - MEASURING TESTING
Information Patent Application
ADJUSTABLE PROBE DEVICE FOR IMPEDANCE TESTING FOR CIRCUIT BOARD
- Publication number 20210102992
- Publication date Apr 8, 2021
- MPI Corporation
- YANG-HUNG CHENG
- G01 - MEASURING TESTING
Information Patent Application
PROBE MODULE
- Publication number 20150168453
- Publication date Jun 18, 2015
- MPI CORPORATION
- WEI-CHENG KU
- G01 - MEASURING TESTING