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Yang Zhao
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Andover, MA, US
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Patents Grants
last 30 patents
Information
Patent Grant
MEMS flow sensor
Patent number
10,139,256
Issue date
Nov 27, 2018
ACEINNA, INC.
Yang Zhao
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for data fusion of a three-axis magnetometer a...
Patent number
9,915,550
Issue date
Mar 13, 2018
Memsic, Inc.
Dong An
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
MEMS thermal flow sensor with compensation for fluid composition
Patent number
9,874,467
Issue date
Jan 23, 2018
ACEINNA, INC.
Thomas O. Maginnis
G01 - MEASURING TESTING
Information
Patent Grant
Method for wafer-level chip scale package testing
Patent number
9,676,619
Issue date
Jun 13, 2017
MEMSIC SEMICONDUCTOR (WUXI) CO., LTD.
Yang Zhao
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Monolithic three-axis magnetic field sensor
Patent number
9,658,298
Issue date
May 23, 2017
Memsic, Inc.
Yongyao Cai
G01 - MEASURING TESTING
Information
Patent Grant
System and method for calibrating a three-axis accelerometer
Patent number
8,718,963
Issue date
May 6, 2014
Memsic, Inc.
Dong An
G01 - MEASURING TESTING
Information
Patent Grant
Z-axis capacitive accelerometer
Patent number
8,701,490
Issue date
Apr 22, 2014
Memsic, Inc.
Leyue Jiang
G01 - MEASURING TESTING
Information
Patent Grant
Location and path-map generation data acquisition and analysis systems
Patent number
8,577,595
Issue date
Nov 5, 2013
Memsic, Inc.
Yang Zhao
G01 - MEASURING TESTING
Information
Patent Grant
Magnetometer
Patent number
8,525,514
Issue date
Sep 3, 2013
Memsic, Inc.
Yongyao Cai
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Ion discharge gyroscope
Patent number
8,146,423
Issue date
Apr 3, 2012
Memsic, Inc.
Yongyao Cai
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic sensor for use with hand-held devices
Patent number
8,139,030
Issue date
Mar 20, 2012
Memsic, Inc.
Yang Zhao
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Three-dimensional multi-chips and tri-axial sensors and methods of...
Patent number
7,536,909
Issue date
May 26, 2009
Memsic, Inc.
Yang Zhao
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Method of wafer-level packaging using low-aspect ratio through-wafe...
Patent number
7,495,462
Issue date
Feb 24, 2009
Memsic, Inc.
Yaping Hua
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Devices, systems, and methods for controlling a shutter
Patent number
7,496,286
Issue date
Feb 24, 2009
Memsic, Inc.
Yang Zhao
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Single chip tri-axis accelerometer
Patent number
7,424,826
Issue date
Sep 16, 2008
Memsic, Inc.
Yaping Hua
G01 - MEASURING TESTING
Information
Patent Grant
Z-axis thermal accelerometer
Patent number
7,392,703
Issue date
Jul 1, 2008
Memsic, Inc.
Yang Zhao
G01 - MEASURING TESTING
Information
Patent Grant
Method and circuitry for thermal accelerometer signal conditioning
Patent number
7,305,881
Issue date
Dec 11, 2007
Memsic, Inc.
Yang Zhao
G01 - MEASURING TESTING
Information
Patent Grant
Chip-scale package for integrated circuits
Patent number
7,295,029
Issue date
Nov 13, 2007
Memsic, Inc.
Yang Zhao
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Wafer-level package for integrated circuits
Patent number
7,262,622
Issue date
Aug 28, 2007
Memsic, Inc.
Yang Zhao
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Thermal convection accelerometer with closed-loop heater control
Patent number
6,795,752
Issue date
Sep 21, 2004
Memsic, Inc.
Yang Zhao
G01 - MEASURING TESTING
Information
Patent Grant
Method of etching a deep trench in a substrate and method of fabric...
Patent number
6,712,983
Issue date
Mar 30, 2004
Memsic, Inc.
Yang Zhao
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Rotatable micromachined device for sensing magnetic fields
Patent number
6,621,266
Issue date
Sep 16, 2003
Analog Devices, Inc.
Richard S. Payne
G01 - MEASURING TESTING
Information
Patent Grant
Rotatable micromachined device for sensing magnetic fields
Patent number
6,233,811
Issue date
May 22, 2001
Analog Devices, Inc.
Richard S. Payne
G01 - MEASURING TESTING
Information
Patent Grant
Conductive plane beneath suspended microstructure
Patent number
5,858,809
Issue date
Jan 12, 1999
Analog Devices
Kevin Hin-Leung Chau
G01 - MEASURING TESTING
Information
Patent Grant
Rotatable micromachined device for sensing magnetic fields
Patent number
5,818,227
Issue date
Oct 6, 1998
Analog Devices, Inc.
Richard S. Payne
G01 - MEASURING TESTING
Information
Patent Grant
Micromachined device packaged to reduce stiction
Patent number
5,694,740
Issue date
Dec 9, 1997
Analog Devices, Inc.
John R. Martin
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Micromechanical structure with textured surface and method for maki...
Patent number
5,679,436
Issue date
Oct 21, 1997
Analog Devices, Inc.
Yang Zhao
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Conductive plane beneath suspended microstructure
Patent number
5,640,039
Issue date
Jun 17, 1997
Analog Devices, Inc.
Kevin Hin-Leung Chau
G01 - MEASURING TESTING
Information
Patent Grant
Method and circuitry for calibrating a micromachined sensor
Patent number
5,621,157
Issue date
Apr 15, 1997
Analog Devices, Inc.
Yang Zhao
G01 - MEASURING TESTING
Information
Patent Grant
High sensitivity integrated micromechanical electrostatic potential...
Patent number
5,517,123
Issue date
May 14, 1996
Analog Devices, Inc.
Yang Zhao
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Magnetic Field Sensor With Three-Dimensional Spiral Reset Coil
Publication number
20170115363
Publication date
Apr 27, 2017
Memsic Semiconductor (Wuxi) Co., Ltd.
Leyue Jiang
G01 - MEASURING TESTING
Information
Patent Application
Method For Wafer-Level Chip Scale Package Testing
Publication number
20170113929
Publication date
Apr 27, 2017
Memsic Semiconductor (Wuxi) Co., Ltd.
Yang Zhao
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
MEMS FLOW SENSOR
Publication number
20170038235
Publication date
Feb 9, 2017
MEMSIC, INC.
Yang Zhao
G01 - MEASURING TESTING
Information
Patent Application
MEMS THERMAL FLOW SENSOR WITH COMPENSATION FOR FLUID COMPOSITION
Publication number
20160245681
Publication date
Aug 25, 2016
MEMSIC, INC.
Thomas O. Maginnis
G01 - MEASURING TESTING
Information
Patent Application
THREE-DIMENSIONAL AIR MOUSE AND DISPLAY USED TOGETHER THEREWITH
Publication number
20160062488
Publication date
Mar 3, 2016
MEMSIC, INC.
Yang Zhao
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MONOLITHIC THREE-AXIS MAGNETIC FIELD SENSOR
Publication number
20150285873
Publication date
Oct 8, 2015
MEMSIC, INC.
Yongyao Cai
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR DATA FUSION OF A THREE-AXIS MAGNETOMETER A...
Publication number
20150177020
Publication date
Jun 25, 2015
MEMSIC, INC.
Dong An
G01 - MEASURING TESTING
Information
Patent Application
MONOLITHIC SENSOR PACKAGE
Publication number
20140130595
Publication date
May 15, 2014
MEMSIC, INC.
Yang Zhao
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
FOLDABLE SUBSTRATE
Publication number
20130249542
Publication date
Sep 26, 2013
Yang Zhao
B32 - LAYERED PRODUCTS
Information
Patent Application
MONOLITHIC TRI-AXIS AMR SENSOR AND MANUFACTURING METHOD THEREOF
Publication number
20120206137
Publication date
Aug 16, 2012
MEMSIC, INC.
Yongyao Cai
G01 - MEASURING TESTING
Information
Patent Application
Z-AXIS CAPACITIVE ACCELEROMETER
Publication number
20120125103
Publication date
May 24, 2012
MEMSIC, INC.
Leyue Jiang
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD OF SENSING ATTITUDE AND ANGULAR RATE USING A MAGN...
Publication number
20110307213
Publication date
Dec 15, 2011
Yang Zhao
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEM AND METHOD FOR CALIBRATING A THREE-AXIS ACCELEROMETER
Publication number
20110264393
Publication date
Oct 27, 2011
Dong An
G01 - MEASURING TESTING
Information
Patent Application
MAGNETOMETER
Publication number
20110227569
Publication date
Sep 22, 2011
Yongyao Cai
G01 - MEASURING TESTING
Information
Patent Application
ION DISCHARGE GYROSCOPE
Publication number
20110005314
Publication date
Jan 13, 2011
Yongyao Cai
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC SENSOR FOR USE WITH HAND-HELD DEVICES
Publication number
20100161084
Publication date
Jun 24, 2010
Yang Zhao
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Location and path-map generation data acquisition and analysis systems
Publication number
20100017124
Publication date
Jan 21, 2010
MEMSIC, INC.
Yang Zhao
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
System for sensing yaw rate using a magnetic field sensor and porta...
Publication number
20080042973
Publication date
Feb 21, 2008
Memsic, Inc.
Yang Zhao
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Devices, systems, and methods for controlling a shutter
Publication number
20070280659
Publication date
Dec 6, 2007
Memsic, Inc.
Yang Zhao
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Three-dimensional multi-chips and tri-axial sensors and methods of...
Publication number
20070170228
Publication date
Jul 26, 2007
Memsic Corporation
Yang Zhao
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Single chip tri-axis accelerometer
Publication number
20070101813
Publication date
May 10, 2007
Memsic, Inc.
Yaping Hua
G01 - MEASURING TESTING
Information
Patent Application
Method of wafer-level packaging using low-aspect ratio through-wafe...
Publication number
20060273430
Publication date
Dec 7, 2006
Memsic, Inc.
Yaping Hua
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Wafer-level package for integrated circuits
Publication number
20060216856
Publication date
Sep 28, 2006
Memsic, Inc.
Yang Zhao
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Chip-scale package for integrated circuits
Publication number
20060216857
Publication date
Sep 28, 2006
Yang Zhao
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method and circuitry for thermal accelerometer signal conditioning
Publication number
20050274180
Publication date
Dec 15, 2005
Memsic, Inc.
Yang Zhao
G01 - MEASURING TESTING
Information
Patent Application
Z-axis thermal accelerometer
Publication number
20050274187
Publication date
Dec 15, 2005
Memsic, Inc.
Yang Zhao
G01 - MEASURING TESTING
Information
Patent Application
Method of etching a deep trench in a substrate and method of fabric...
Publication number
20020148807
Publication date
Oct 17, 2002
Yang Zhao
B81 - MICRO-STRUCTURAL TECHNOLOGY