Yangyang DAI

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Hefei, CN

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Patents Grantslast 30 patents

Information Patent Grant
Method for testing memory
- Patent number 11,929,137
- Issue date Mar 12, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Yangyang Dai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated circuit (IC) power-up testing method and device, and ele...
- Patent number 11,409,623
- Issue date Aug 9, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Yangyang Dai
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR FORMING DATABASE FOR MEMORY TEST AND METHOD FOR TESTING...
- Publication number 20220075755
- Publication date Mar 10, 2022
- CHANGXIN MEMORY TECHNOLOGIES,INC.
- Yangyang DAI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR TESTING MEMORY
- Publication number 20220075550
- Publication date Mar 10, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Yangyang DAI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED CIRCUIT (IC) POWER-UP TESTING METHOD AND DEVICE, AND ELE...
- Publication number 20210224172
- Publication date Jul 22, 2021
- Changxin Memory Technologies, Inc.
- Yangyang DAI
- G06 - COMPUTING CALCULATING COUNTING