Yangyang SUN

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Interference in-sensitive Littrow system for optical device structu...
- Patent number 12,203,747
- Issue date Jan 21, 2025
- Applied Materials, Inc.
- Yangyang Sun
- G01 - MEASURING TESTING
Information Patent Grant
Optical resolution measurement method for optical devices
- Patent number 12,165,341
- Issue date Dec 10, 2024
- Applied Materials, Inc.
- Jinxin Fu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Full-field metrology tool for waveguide combiners and meta-surfaces
- Patent number 12,019,242
- Issue date Jun 25, 2024
- Applied Materials, Inc.
- Yangyang Sun
- G02 - OPTICS
Information Patent Grant
Illumination system for AR metrology tool
- Patent number 11,988,574
- Issue date May 21, 2024
- Applied Materials, Inc.
- Yangyang Sun
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
See-through metrology systems, apparatus, and methods for optical d...
- Patent number 11,978,196
- Issue date May 7, 2024
- Yangyang Sun
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Interference in-sensitive Littrow system for optical device structu...
- Patent number 11,913,776
- Issue date Feb 27, 2024
- Applied Materials, Inc.
- Yangyang Sun
- G01 - MEASURING TESTING
Information Patent Grant
See-through metrology systems, apparatus, and methods for optical d...
- Patent number 11,748,875
- Issue date Sep 5, 2023
- Applied Materials, Inc.
- Yangyang Sun
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
ILLUMINATION SYSTEM FOR AR METROLOGY TOOL
- Publication number 20240385075
- Publication date Nov 21, 2024
- Applied Materials, Inc.
- Yangyang SUN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LOW REFRACTIVE INDEX MATERIALS ON THE GRATINGS TO IMPROVE THE WAVEG...
- Publication number 20240329322
- Publication date Oct 3, 2024
- Applied Materials, Inc.
- Jinyu LU
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
FULL-FIELD METROLOGY TOOL FOR WAVEGUIDE COMBINERS AND META-SURFACES
- Publication number 20240310639
- Publication date Sep 19, 2024
- Applied Materials, Inc.
- Yangyang SUN
- G02 - OPTICS
Information Patent Application
INTERFERENCE IN-SENSITIVE LITTROW SYSTEM FOR OPTICAL DEVICE STRUCTU...
- Publication number 20240142227
- Publication date May 2, 2024
- Applied Materials, Inc.
- Yangyang SUN
- G01 - MEASURING TESTING
Information Patent Application
METHODS OF GEOMETRY PARAMETERS MEASUREMENT FOR OPTICAL GRATINGS
- Publication number 20240142339
- Publication date May 2, 2024
- Applied Materials, Inc.
- Yangyang SUN
- G01 - MEASURING TESTING
Information Patent Application
METHODS FOR HIGH-RESOLUTION, STABLE MEASUREMENT OF PITCH AND ORIENT...
- Publication number 20230314126
- Publication date Oct 5, 2023
- Applied Materials, Inc.
- Yangyang SUN
- G02 - OPTICS
Information Patent Application
HIGH-PRECISION AND HIGH-THROUGHPUT MEASUREMENT OF PERCENTAGE LIGHT...
- Publication number 20230251161
- Publication date Aug 10, 2023
- Applied Materials, Inc.
- Baochen WU
- G01 - MEASURING TESTING
Information Patent Application
FULL-FIELD METROLOGY TOOL FOR WAVEGUIDE COMBINERS AND META-SURFACES
- Publication number 20230046330
- Publication date Feb 16, 2023
- Applied Materials, Inc.
- Yangyang SUN
- G02 - OPTICS
Information Patent Application
ULTRA-WIDE ANGLE LENS SYSTEMS WITH EXTERNAL PUPIL
- Publication number 20220397744
- Publication date Dec 15, 2022
- Applied Materials, Inc.
- Wubin PANG
- G02 - OPTICS
Information Patent Application
STACKED METALENS SURFACES FOR 3D SENSORs
- Publication number 20220308263
- Publication date Sep 29, 2022
- Applied Materials, Inc.
- Jinxin FU
- G02 - OPTICS
Information Patent Application
METHOD OF MEASURING EFFICIENCY FOR OPTICAL DEVICES
- Publication number 20220291082
- Publication date Sep 15, 2022
- Applied Materials, Inc.
- Jinxin FU
- G01 - MEASURING TESTING
Information Patent Application
INTERFERENCE IN-SENSITIVE LITTROW SYSTEM FOR OPTICAL DEVICE STRUCTU...
- Publication number 20220214163
- Publication date Jul 7, 2022
- Applied Materials, Inc.
- Yangyang SUN
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL RESOLUTION MEASUREMENT METHOD FOR OPTICAL DEVICES
- Publication number 20220164972
- Publication date May 26, 2022
- Applied Materials, Inc.
- Jinxin FU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ILLUMINATION SYSTEM FOR AR METROLOGY TOOL
- Publication number 20220163423
- Publication date May 26, 2022
- Applied Materials, Inc.
- Yangyang SUN
- G01 - MEASURING TESTING
Information Patent Application
IN-LINE METROLOGY SYSTEMS, APPARATUS, AND METHODS FOR OPTICAL DEVICES
- Publication number 20220122240
- Publication date Apr 21, 2022
- Applied Materials, Inc.
- Yangyang SUN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEE-THROUGH METROLOGY SYSTEMS, APPARATUS, AND METHODS FOR OPTICAL D...
- Publication number 20220121030
- Publication date Apr 21, 2022
- Applied Materials, Inc.
- Yangyang SUN
- G02 - OPTICS
Information Patent Application
SEE-THROUGH METROLOGY SYSTEMS, APPARATUS, AND METHODS FOR OPTICAL D...
- Publication number 20220120700
- Publication date Apr 21, 2022
- Applied Materials, Inc.
- Yangyang SUN
- G02 - OPTICS
Information Patent Application
IN-LINE METROLOGY SYSTEMS, APPARATUS, AND METHODS FOR OPTICAL DEVICES
- Publication number 20220122241
- Publication date Apr 21, 2022
- Applied Materials, Inc.
- Yangyang SUN
- G06 - COMPUTING CALCULATING COUNTING

Yangyang SUN

Person

Patents Grantslast 30 patents

Interference in-sensitive Littrow system for optical device structu...

Optical resolution measurement method for optical devices

Full-field metrology tool for waveguide combiners and meta-surfaces

Illumination system for AR metrology tool

See-through metrology systems, apparatus, and methods for optical d...

Interference in-sensitive Littrow system for optical device structu...

See-through metrology systems, apparatus, and methods for optical d...

Patents Applicationslast 30 patents

ILLUMINATION SYSTEM FOR AR METROLOGY TOOL

LOW REFRACTIVE INDEX MATERIALS ON THE GRATINGS TO IMPROVE THE WAVEG...

FULL-FIELD METROLOGY TOOL FOR WAVEGUIDE COMBINERS AND META-SURFACES

INTERFERENCE IN-SENSITIVE LITTROW SYSTEM FOR OPTICAL DEVICE STRUCTU...

METHODS OF GEOMETRY PARAMETERS MEASUREMENT FOR OPTICAL GRATINGS

METHODS FOR HIGH-RESOLUTION, STABLE MEASUREMENT OF PITCH AND ORIENT...

HIGH-PRECISION AND HIGH-THROUGHPUT MEASUREMENT OF PERCENTAGE LIGHT...

FULL-FIELD METROLOGY TOOL FOR WAVEGUIDE COMBINERS AND META-SURFACES

ULTRA-WIDE ANGLE LENS SYSTEMS WITH EXTERNAL PUPIL

STACKED METALENS SURFACES FOR 3D SENSORs

METHOD OF MEASURING EFFICIENCY FOR OPTICAL DEVICES

INTERFERENCE IN-SENSITIVE LITTROW SYSTEM FOR OPTICAL DEVICE STRUCTU...

OPTICAL RESOLUTION MEASUREMENT METHOD FOR OPTICAL DEVICES

ILLUMINATION SYSTEM FOR AR METROLOGY TOOL

IN-LINE METROLOGY SYSTEMS, APPARATUS, AND METHODS FOR OPTICAL DEVICES

SEE-THROUGH METROLOGY SYSTEMS, APPARATUS, AND METHODS FOR OPTICAL D...

SEE-THROUGH METROLOGY SYSTEMS, APPARATUS, AND METHODS FOR OPTICAL D...

IN-LINE METROLOGY SYSTEMS, APPARATUS, AND METHODS FOR OPTICAL DEVICES