Yanir Hainick

Person

Tel-Aviv, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Raman spectroscopy based measurements in patterned structures
- Patent number 12,066,385
- Issue date Aug 20, 2024
- Nova Ltd.
- Gilad Barak
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Hybrid metrology method and system
- Patent number 12,025,560
- Issue date Jul 2, 2024
- Gilad Barak
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical phase measurement system and method
- Patent number 11,946,875
- Issue date Apr 2, 2024
- Nova Ltd.
- Gilad Barak
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Optical phase measurement system and method
- Patent number 11,460,415
- Issue date Oct 4, 2022
- Nova Ltd.
- Gilad Barak
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Time-domain optical metrology and inspection of semiconductor devices
- Patent number 11,366,398
- Issue date Jun 21, 2022
- Nova Ltd.
- Gilad Barak
- G01 - MEASURING TESTING
Information Patent Grant
Raman spectroscopy based measurements in patterned structures
- Patent number 11,275,027
- Issue date Mar 15, 2022
- Nova Ltd.
- Gilad Barak
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Hybrid metrology method and system
- Patent number 11,150,190
- Issue date Oct 19, 2021
- Nova Ltd.
- Gilad Barak
- G01 - MEASURING TESTING
Information Patent Grant
Optical phase measurement method and system
- Patent number 11,029,258
- Issue date Jun 8, 2021
- Nova Measuring Instruments Ltd.
- Gilad Barak
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for optical metrology in patterned structures
- Patent number 10,761,036
- Issue date Sep 1, 2020
- Nova Measuring Instruments Ltd.
- Boris Levant
- G01 - MEASURING TESTING
Information Patent Grant
Hybrid metrology method and system
- Patent number 10,732,116
- Issue date Aug 4, 2020
- NOVA MEASURING INSTRUMENTS LTD.
- Gilad Barak
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical phase measurement system and method
- Patent number 10,663,408
- Issue date May 26, 2020
- Nova Measuring Instruments Ltd.
- Gilad Barak
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Raman spectroscopy based measurements in patterned structures
- Patent number 10,564,106
- Issue date Feb 18, 2020
- Nova Measuring Instruments Ltd.
- Gilad Barak
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Optical phase measurement method and system
- Patent number 10,365,231
- Issue date Jul 30, 2019
- Nova Measuring Instruments Ltd.
- Gilad Barak
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and system for optical metrology in patterned structures
- Patent number 10,274,435
- Issue date Apr 30, 2019
- Nova Measuring Instruments Ltd.
- Boris Levant
- G01 - MEASURING TESTING
Information Patent Grant
Optical phase measurement method and system
- Patent number 10,161,885
- Issue date Dec 25, 2018
- Nova Measuring Instruments Ltd.
- Gilad Barak
- G01 - MEASURING TESTING
Information Patent Grant
Optical method and system for measuring isolated features of a stru...
- Patent number 10,073,045
- Issue date Sep 11, 2018
- Nova Measuring Instruments Ltd.
- Gilad Barak
- G01 - MEASURING TESTING
Information Patent Grant
Optical phase measurement method and system
- Patent number 9,897,553
- Issue date Feb 20, 2018
- Nova Measuring Instruments Ltd.
- Gilad Barak
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
HYBRID METROLOGY METHOD AND SYSTEM
- Publication number 20250003882
- Publication date Jan 2, 2025
- NOVA LTD
- GILAD BARAK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM
- Publication number 20240361253
- Publication date Oct 31, 2024
- NOVA LTD
- Gilad BARAK
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR DIGITAL OPTICAL ABERRATION CORRECTION AND SPE...
- Publication number 20230177655
- Publication date Jun 8, 2023
- PXE COMPUTATIONAL IMAGING LTD
- Yoav Berlatzky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL PHASE MEASUREMENT SYSTEM AND METHOD
- Publication number 20230130231
- Publication date Apr 27, 2023
- NOVA LTD
- Gilad BARAK
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR OPTICAL IMAGING AND MEASUREMENT OF OBJECTS
- Publication number 20230029930
- Publication date Feb 2, 2023
- PXE COMPUTATIONAL IMAGING LTD
- Yoav Berlatzky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TIME-DOMAIN OPTICAL METROLOGY AND INSPECTION OF SEMICONDUCTOR DEVICES
- Publication number 20220390858
- Publication date Dec 8, 2022
- NOVA LTD
- GILAD BARAK
- G01 - MEASURING TESTING
Information Patent Application
RAMAN SPECTROSCOPY BASED MEASUREMENTS IN PATTERNED STRUCTURES
- Publication number 20220326159
- Publication date Oct 13, 2022
- NOVA LTD
- Gilad Barak
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
HYBRID METROLOGY METHOD AND SYSTEM
- Publication number 20220120690
- Publication date Apr 21, 2022
- NOVA LTD
- GILAD BARAK
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM
- Publication number 20210364451
- Publication date Nov 25, 2021
- NOVA MEASURING INSTRUMENTS LTD.
- Gilad BARAK
- G01 - MEASURING TESTING
Information Patent Application
HYBRID METROLOGY METHOD AND SYSTEM
- Publication number 20210003508
- Publication date Jan 7, 2021
- NOVA MEASURING INSTRUMENTS LTD.
- GILAD BARAK
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
OPTICAL PHASE MEASUREMENT SYSTEM AND METHOD
- Publication number 20200355622
- Publication date Nov 12, 2020
- NOVA MEASURING INSTRUMENTS LTD.
- Gilad BARAK
- G01 - MEASURING TESTING
Information Patent Application
RAMAN SPECTROSCOPY BASED MEASUREMENTS IN PATTERNED STRUCTURES
- Publication number 20200256799
- Publication date Aug 13, 2020
- NOVA MEASURING INSTRUMENTS LTD.
- GILAD BARAK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICAL PHASE MEASUREMENT SYSTEM AND METHOD
- Publication number 20200025693
- Publication date Jan 23, 2020
- NOVA MEASURING INSTRUMENTS LTD.
- Gilad BARAK
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR OPTICAL METROLOGY IN PATTERNED STRUCTURES
- Publication number 20190317024
- Publication date Oct 17, 2019
- NOVA MEASURING INSTRUMENTS LTD.
- Boris LEVANT
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM
- Publication number 20190154594
- Publication date May 23, 2019
- NOVA MEASURING INSTRUMENTS LTD.
- Gilad BARAK
- G01 - MEASURING TESTING
Information Patent Application
RAMAN SPECTROSCOPY BASED MEASUREMENTS IN PATTERNED STRUCTURES
- Publication number 20180372644
- Publication date Dec 27, 2018
- NOVA MEASURING INSTRUMENTS LTD.
- GILAD BARAK
- G01 - MEASURING TESTING
Information Patent Application
HYBRID METROLOGY METHOD AND SYSTEM
- Publication number 20180372645
- Publication date Dec 27, 2018
- NOVA MEASURING INSTRUMENTS LTD.
- GILAD BARAK
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM
- Publication number 20180128753
- Publication date May 10, 2018
- NOVA MEASURING INSTRUMENTS LTD.
- Gilad BARAK
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR OPTICAL METROLOGY IN PATTERNED STRUCTURES
- Publication number 20180052119
- Publication date Feb 22, 2018
- NOVA MEASURING INSTRUMENTS LTD.
- Boris LEVANT
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM
- Publication number 20170016835
- Publication date Jan 19, 2017
- NOVA MEASURING INSTRUMENTS LTD.
- Gilad BARAK
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM
- Publication number 20150377799
- Publication date Dec 31, 2015
- NOVA MEASURING INSTRUMENTS LTD.
- Gilad BARAK
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL METHOD AND SYSTEM FOR MEASURING ISOLATED FEATURES OF A STRU...
- Publication number 20150212012
- Publication date Jul 30, 2015
- NOVA MEASURING INSTRUMENTS LTD.
- Gilad Barak
- G01 - MEASURING TESTING

Yanir Hainick

Person

Patents Grantslast 30 patents

Raman spectroscopy based measurements in patterned structures

Hybrid metrology method and system

Optical phase measurement system and method

Optical phase measurement system and method

Time-domain optical metrology and inspection of semiconductor devices

Raman spectroscopy based measurements in patterned structures

Hybrid metrology method and system

Optical phase measurement method and system

Method and system for optical metrology in patterned structures

Hybrid metrology method and system

Optical phase measurement system and method

Raman spectroscopy based measurements in patterned structures

Optical phase measurement method and system

Method and system for optical metrology in patterned structures

Optical phase measurement method and system

Optical method and system for measuring isolated features of a stru...

Optical phase measurement method and system

Patents Applicationslast 30 patents

HYBRID METROLOGY METHOD AND SYSTEM

OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM

SYSTEM AND METHOD FOR DIGITAL OPTICAL ABERRATION CORRECTION AND SPE...

OPTICAL PHASE MEASUREMENT SYSTEM AND METHOD

SYSTEM AND METHOD FOR OPTICAL IMAGING AND MEASUREMENT OF OBJECTS

TIME-DOMAIN OPTICAL METROLOGY AND INSPECTION OF SEMICONDUCTOR DEVICES

RAMAN SPECTROSCOPY BASED MEASUREMENTS IN PATTERNED STRUCTURES

HYBRID METROLOGY METHOD AND SYSTEM

OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM

HYBRID METROLOGY METHOD AND SYSTEM

OPTICAL PHASE MEASUREMENT SYSTEM AND METHOD

RAMAN SPECTROSCOPY BASED MEASUREMENTS IN PATTERNED STRUCTURES

OPTICAL PHASE MEASUREMENT SYSTEM AND METHOD

METHOD AND SYSTEM FOR OPTICAL METROLOGY IN PATTERNED STRUCTURES

OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM

RAMAN SPECTROSCOPY BASED MEASUREMENTS IN PATTERNED STRUCTURES

HYBRID METROLOGY METHOD AND SYSTEM

OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM

METHOD AND SYSTEM FOR OPTICAL METROLOGY IN PATTERNED STRUCTURES

OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM

OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM

OPTICAL METHOD AND SYSTEM FOR MEASURING ISOLATED FEATURES OF A STRU...