Yanko Sheiretov

Person

Cambridge, MA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for measurement of material condition
- Patent number 11,959,880
- Issue date Apr 16, 2024
- JENTEK Sensors, Inc.
- Scott A Denenberg
- G01 - MEASURING TESTING
Information Patent Grant
Measurement system and method of use
- Patent number 11,841,245
- Issue date Dec 12, 2023
- JENTEK Sensors, Inc.
- Neil J Goldfine
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Measurement system and method of use
- Patent number 11,549,831
- Issue date Jan 10, 2023
- JENTEK Sensors, Inc.
- Neil J Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measurement of material condition
- Patent number 11,092,571
- Issue date Aug 17, 2021
- JENTEK Sensors, Inc.
- Scott A Denenberg
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspection of corrosion and other defects...
- Patent number 10,732,096
- Issue date Aug 4, 2020
- Jentek Sensors, Inc.
- Scott A. Denenberg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated sensor cartridge system and method of use
- Patent number 10,677,756
- Issue date Jun 9, 2020
- Jentek Sensors, Inc.
- Neil J Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Measurement system and method of use
- Patent number 10,416,118
- Issue date Sep 17, 2019
- JENTEK Sensors, Inc.
- Neil J Goldfine
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Portable test instrument
- Patent number D857534
- Issue date Aug 27, 2019
- JENTEK Sensors, Inc.
- Todd M Dunford
- D10 - Measuring, testing, or signalling instruments
Information Patent Grant
Method and apparatus for measurement of material condition
- Patent number 10,324,062
- Issue date Jun 18, 2019
- JENTEK Sensors, Inc.
- Scott A Denenberg
- G01 - MEASURING TESTING
Information Patent Grant
Portable test instrument
- Patent number D830863
- Issue date Oct 16, 2018
- Todd M Dunford
- D10 - Measuring, testing, or signalling instruments
Information Patent Grant
Performance curve generation for non-destructive testing sensors
- Patent number 10,001,457
- Issue date Jun 19, 2018
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspection of corrosion and other defects...
- Patent number 9,823,179
- Issue date Nov 21, 2017
- Jentek Sensors, Inc.
- Scott A. Denenberg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for inspection of corrosion and other defects...
- Patent number 9,255,875
- Issue date Feb 9, 2016
- Jentek Sensors, Inc.
- Scott A. Denenberg
- G01 - MEASURING TESTING
Information Patent Grant
Remaining life prediction for individual components from sparse data
- Patent number 8,768,657
- Issue date Jul 1, 2014
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Component adaptive life management
- Patent number 8,494,810
- Issue date Jul 23, 2013
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G07 - CHECKING-DEVICES
Information Patent Grant
Method for stress assessment that removes temperature effects and h...
- Patent number 8,415,947
- Issue date Apr 9, 2013
- Jentek Sensors, Inc.
- Yanko K. Sheiretov
- G01 - MEASURING TESTING
Information Patent Grant
Test circuit with sense elements having associated and unassociated...
- Patent number 8,222,897
- Issue date Jul 17, 2012
- Jentek Sensors, Inc.
- Yanko K. Sheiretov
- G01 - MEASURING TESTING
Information Patent Grant
Material property estimation using inverse interpolation
- Patent number 8,050,883
- Issue date Nov 1, 2011
- Jentek Sensors, Inc.
- Yanko Konstantinov Sheiretov
- G01 - MEASURING TESTING
Information Patent Grant
Material condition assessment with eddy current sensors
- Patent number 7,812,601
- Issue date Oct 12, 2010
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Quasistatic magnetic and electric field stress/strain gages
- Patent number 7,533,575
- Issue date May 19, 2009
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Fastener and fitting based sensing methods
- Patent number 7,528,598
- Issue date May 5, 2009
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Material property estimation using non-orthogonal responsive databases
- Patent number 7,467,057
- Issue date Dec 16, 2008
- Jentek Sensors, Inc.
- Yanko Konstantinov Sheiretov
- G01 - MEASURING TESTING
Information Patent Grant
Local feature characterization using quasistatic electromagnetic se...
- Patent number 7,289,913
- Issue date Oct 30, 2007
- Jentek Sensors, Inc.
- Darrell E. Schlicker
- G01 - MEASURING TESTING
Information Patent Grant
Segmented field dielectric sensor array for material characterization
- Patent number 7,280,940
- Issue date Oct 9, 2007
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Grant
Segmented field dielectrometer
- Patent number 6,486,673
- Issue date Nov 26, 2002
- Jentek Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MEASUREMENT SYSTEM AND METHOD OF USE
- Publication number 20240255323
- Publication date Aug 1, 2024
- JENTEK Sensors, Inc.
- Neil J Goldfine
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
MEASUREMENT SYSTEM AND METHOD OF USE
- Publication number 20230160728
- Publication date May 25, 2023
- JENTEK Sensors, Inc.
- Neil J Goldfine
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
MEASUREMENT SYSTEM AND METHOD OF USE
- Publication number 20220373367
- Publication date Nov 24, 2022
- JENTEK Sensors, Inc.
- Neil J Goldfine
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Method and Apparatus for Measurement of Material Condition
- Publication number 20210372968
- Publication date Dec 2, 2021
- JENTEK Sensors, Inc.
- Scott A. Denenberg
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT SYSTEM AND METHOD OF USE
- Publication number 20210080297
- Publication date Mar 18, 2021
- JENTEK Sensors, Inc.
- Neil J Goldfine
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Method and Apparatus for Measurement of Material Condition
- Publication number 20190323992
- Publication date Oct 24, 2019
- JENTEK Sensors, Inc.
- Scott A. Denenberg
- G01 - MEASURING TESTING
Information Patent Application
Method And Apparatus For Inspection Of Corrosion And Other Defects...
- Publication number 20180209894
- Publication date Jul 26, 2018
- JENTEK Sensors, Inc.
- Scott A. Denenberg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED SENSOR CARTRIDGE SYSTEM AND METHOD OF USE
- Publication number 20160349214
- Publication date Dec 1, 2016
- JENTEK Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Measurement of Material Condition
- Publication number 20160274060
- Publication date Sep 22, 2016
- JENTEK Sensors, Inc.
- Scott A Denenberg
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR INSPECTION OF CORROSION AND OTHER DEFECTS...
- Publication number 20160238514
- Publication date Aug 18, 2016
- JENTEK Sensors, Inc.
- Scott A. Denenberg
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Inspection of Corrosion and Other Defects...
- Publication number 20130124109
- Publication date May 16, 2013
- JENTEK Sensors, Inc.
- Scott A. Denenberg
- G01 - MEASURING TESTING
Information Patent Application
Test Circuit With Sense Elements Having Associated And Unassociated...
- Publication number 20130014589
- Publication date Jan 17, 2013
- Yanko K. Sheiretov
- G01 - MEASURING TESTING
Information Patent Application
Performance Curve Generation For Non-Destructive Testing Sensors
- Publication number 20120271824
- Publication date Oct 25, 2012
- JENTEK Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Application
Material Property Estimation Using Inverse Interpolation
- Publication number 20120013334
- Publication date Jan 19, 2012
- JENTEK Sensors, Inc.
- Yanko Konstantinov Sheiretov
- G01 - MEASURING TESTING
Information Patent Application
Component Adaptive Life Management
- Publication number 20110060568
- Publication date Mar 10, 2011
- JENTEK Sensors, Inc.
- Neil J. Goldfine
- G07 - CHECKING-DEVICES
Information Patent Application
Component Adaptive Life Management
- Publication number 20110054806
- Publication date Mar 3, 2011
- JENTEK Sensors, Inc.
- Neil J. Goldfine
- G07 - CHECKING-DEVICES
Information Patent Application
Material Condition Assessment with Eddy Current Sensors
- Publication number 20100026285
- Publication date Feb 4, 2010
- JENTEK Sensors, Inc.
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Application
Material property estimation using inverse interpolation
- Publication number 20090192755
- Publication date Jul 30, 2009
- JENTEK Sensors, Inc.
- Yanko Konstantinov Sheiretov
- G01 - MEASURING TESTING
Information Patent Application
Torque and load monitoring using magnetic sensor arrays
- Publication number 20090001974
- Publication date Jan 1, 2009
- JENTEK Sensors, Inc.
- Yanko K. Sheiretov
- G01 - MEASURING TESTING
Information Patent Application
Remaining life prediction for individual components from sparse data
- Publication number 20070239407
- Publication date Oct 11, 2007
- Neil J. Goldfine
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Material characterization with model based sensors
- Publication number 20070069720
- Publication date Mar 29, 2007
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Application
Fastener and fitting based sensing methods
- Publication number 20070007955
- Publication date Jan 11, 2007
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Application
Material condition assessment with eddy current sensors
- Publication number 20060244443
- Publication date Nov 2, 2006
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Application
Segmented field dielectric sensor array for material characterization
- Publication number 20060247896
- Publication date Nov 2, 2006
- Neil J. Goldfine
- G01 - MEASURING TESTING
Information Patent Application
Local feature characterization using quasistatic electromagnetic se...
- Publication number 20060097718
- Publication date May 11, 2006
- Darrell E. Schlicker
- G01 - MEASURING TESTING

Yanko Sheiretov

Person

Patents Grantslast 30 patents

Method and apparatus for measurement of material condition

Measurement system and method of use

Measurement system and method of use

Method and apparatus for measurement of material condition

Method and apparatus for inspection of corrosion and other defects...

Integrated sensor cartridge system and method of use

Measurement system and method of use

Portable test instrument

Method and apparatus for measurement of material condition

Portable test instrument

Performance curve generation for non-destructive testing sensors

Method and apparatus for inspection of corrosion and other defects...

Method and apparatus for inspection of corrosion and other defects...

Remaining life prediction for individual components from sparse data

Component adaptive life management

Method for stress assessment that removes temperature effects and h...

Test circuit with sense elements having associated and unassociated...

Material property estimation using inverse interpolation

Material condition assessment with eddy current sensors

Quasistatic magnetic and electric field stress/strain gages

Fastener and fitting based sensing methods

Material property estimation using non-orthogonal responsive databases

Local feature characterization using quasistatic electromagnetic se...

Segmented field dielectric sensor array for material characterization

Segmented field dielectrometer

Patents Applicationslast 30 patents

MEASUREMENT SYSTEM AND METHOD OF USE

MEASUREMENT SYSTEM AND METHOD OF USE

MEASUREMENT SYSTEM AND METHOD OF USE

Method and Apparatus for Measurement of Material Condition

MEASUREMENT SYSTEM AND METHOD OF USE

Method and Apparatus for Measurement of Material Condition

Method And Apparatus For Inspection Of Corrosion And Other Defects...

INTEGRATED SENSOR CARTRIDGE SYSTEM AND METHOD OF USE

Method and Apparatus for Measurement of Material Condition

METHOD AND APPARATUS FOR INSPECTION OF CORROSION AND OTHER DEFECTS...

Method and Apparatus for Inspection of Corrosion and Other Defects...

Test Circuit With Sense Elements Having Associated And Unassociated...

Performance Curve Generation For Non-Destructive Testing Sensors

Material Property Estimation Using Inverse Interpolation

Component Adaptive Life Management

Component Adaptive Life Management

Material Condition Assessment with Eddy Current Sensors

Material property estimation using inverse interpolation

Torque and load monitoring using magnetic sensor arrays

Remaining life prediction for individual components from sparse data

Material characterization with model based sensors

Fastener and fitting based sensing methods

Material condition assessment with eddy current sensors

Segmented field dielectric sensor array for material characterization

Local feature characterization using quasistatic electromagnetic se...