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Yannick Berker
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Witten, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Estimation of an attenuation map based on scattered coincidences in...
Patent number
10,542,956
Issue date
Jan 28, 2020
Koninklijke Philips N.V.
Yannick Berker
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Density guided attenuation map generation in PET/MR systems
Patent number
10,386,439
Issue date
Aug 20, 2019
Koninklike Philips N.V.
Yannick Berker
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System for simultaneous PET/MR imaging
Patent number
10,288,702
Issue date
May 14, 2019
Koninklijke Philips N.V.
Volkmar Schulz
G01 - MEASURING TESTING
Information
Patent Grant
Scintillation event position determination in a radiation particle...
Patent number
9,903,960
Issue date
Feb 27, 2018
Koninklijke Philips N.V.
Yannick Berker
G01 - MEASURING TESTING
Information
Patent Grant
Attenuation map with scattered coincidences in Positron Emission To...
Patent number
9,734,600
Issue date
Aug 15, 2017
KONINKLLIJKE PHILIPS N.V.
Yannick Berker
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Method for determining the distribution of an imaging agent
Patent number
9,177,376
Issue date
Nov 3, 2015
Koninklijke Philips N.V.
Yannick Berker
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Patents Applications
last 30 patents
Information
Patent Application
ESTIMATION OF AN ATTENUATION MAP BASED ON SCATTERED COINCIDENCES IN...
Publication number
20180116621
Publication date
May 3, 2018
Yannick BERKER
G01 - MEASURING TESTING
Information
Patent Application
SCINTILLATION EVENT POSITION DETERMINATION IN A RADIATION PARTICLE...
Publication number
20180059266
Publication date
Mar 1, 2018
Koninklijke Philips N.V.
Yannick Berker
G01 - MEASURING TESTING
Information
Patent Application
DENSITY GUIDED ATTENUATION MAP GENERATION IN PET/MR SYSTEMS
Publication number
20160320466
Publication date
Nov 3, 2016
Koninklijke Philips N.V.
Yannick BERKER
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM FOR SIMULTANEOUS PET/MR IMAGING
Publication number
20160103194
Publication date
Apr 14, 2016
Volkmar SCHULZ
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR DETERMINING THE DISTRIBUTION OF AN IMAGING AGENT
Publication number
20150221083
Publication date
Aug 6, 2015
Koninklijke Philips N.V.
Yannick Berker
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
ATTENUATION MAP WITH SCATTERED COINCIDENCES IN POSITRON EMISSION TO...
Publication number
20150098640
Publication date
Apr 9, 2015
Koninklijke Philips N.V.
Yannick Berker
G01 - MEASURING TESTING