Yanwen Hou

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Hackettstown, NJ, US

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Patents Grantslast 30 patents

Information Patent Grant
Combination of ellipsometry and optical stress generation and detec...
- Patent number 7,903,238
- Issue date Mar 8, 2011
- Rudolph Technologies, Inc.
- Manjusha Mehendale
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Combination of ellipsometry and optical stress generation and detec...
- Publication number 20090244516
- Publication date Oct 1, 2009
- Manjusha Mehendale
- G01 - MEASURING TESTING