Yao-Wei Tien

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Hualien City, TW

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Patents Grantslast 30 patents

Information Patent Grant
System and method for defect analysis of a substrate
- Patent number 9,734,572
- Issue date Aug 15, 2017
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yao-Wei Tien
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR DEFECT ANALYSIS OF A SUBSTRATE
- Publication number 20150146968
- Publication date May 28, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yao-Wei Tien
- G06 - COMPUTING CALCULATING COUNTING