Yaoming Shen

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Santa Clara, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Probing circuit features in sub-32 NM semiconductor integrated circuit
- Patent number 9,025,147
- Issue date May 5, 2015
- CheckPoint Technologies, LLC
- Yaoming Shen
- G01 - MEASURING TESTING
Information Patent Grant
Probing circuit features in sub-32 nm semiconductor integrated circuit
- Patent number 8,749,784
- Issue date Jun 10, 2014
- CheckPoint Technologies, LLC
- Yaoming Shen
- G01 - MEASURING TESTING