Yaoping Wang

Person

Beijing, CN

People

Patents Grantslast 30 patents

Information Patent Grant
Image annotation method, device and system
- Patent number 12,106,465
- Issue date Oct 1, 2024
- BOE Technology Group Co., Ltd.
- Yaoping Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and device for processing product manufacturing messages, el...
- Patent number 12,020,516
- Issue date Jun 25, 2024
- BOE Technology Group Co., Ltd.
- Meijuan Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect detection task processing method, device, apparatus and stor...
- Patent number 11,982,999
- Issue date May 14, 2024
- BEIJING ZHONGXIANGYING TECHNOLOGY CO., LTD.
- Meijuan Zhang
- G05 - CONTROLLING REGULATING
Information Patent Grant
Distributed computing system for product defect analysis
- Patent number 11,880,968
- Issue date Jan 23, 2024
- BOE Technology Group Co., Ltd.
- Zhaoyue Li
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
IMAGE RECOGNITION METHOD AND SYSTEM, AND TRAINING METHOD AND AN ELE...
- Publication number 20240303798
- Publication date Sep 12, 2024
- Beijing BOE Technology Development Co., Ltd.
- Chao JI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND DEVICE FOR PROCESSING PRODUCT MANUFACTURING MESSAGES, EL...
- Publication number 20240304034
- Publication date Sep 12, 2024
- BOE TECHNOLOGY GROUP CO., LTD.
- Meijuan ZHANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND DEVICE FOR DETECTING DEFECT, STORAGE MEDIUM AND ELECTRON...
- Publication number 20240202893
- Publication date Jun 20, 2024
- Beijing Zhongxiangying Technology Co., Ltd.
- Yaoping WANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR DEVICE CONFIGURATION PARAMETER PROCESSING,...
- Publication number 20240048441
- Publication date Feb 8, 2024
- Beijing BOE Technology Development Co., Ltd.
- Junjie Zhao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR DETECTING DEFECT AND METHOD FOR TRAINING MODEL
- Publication number 20230206420
- Publication date Jun 29, 2023
- Beijing Zhongxiangying Technology Co., Ltd.
- Yaoping WANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DISTRIBUTED COMPUTING SYSTEM FOR PRODUCT DEFECT ANALYSIS
- Publication number 20230153974
- Publication date May 18, 2023
- BOE TECHNOLOGY GROUP CO., LTD.
- Zhaoyue LI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND DEVICE FOR PROCESSING PRODUCT MANUFACTURING MESSAGES, EL...
- Publication number 20230142383
- Publication date May 11, 2023
- BOE TECHNOLOGY GROUP CO., LTD.
- Meijuan ZHANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR DETECTING DEFECT AND METHOD FOR TRAINING MODEL
- Publication number 20230048386
- Publication date Feb 16, 2023
- BEIJING ZHONGXIANGYING TECHNOLOGY CO.,LTD.
- Yaoping WANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TASK PROCESSING METHOD BASED ON DEFECT DETECTION, DEVICE, APPARATUS...
- Publication number 20230030296
- Publication date Feb 2, 2023
- Beijing Zhongxiangying Technology Co., Ltd.
- Meijuan ZHANG
- G05 - CONTROLLING REGULATING
Information Patent Application
IMAGE ANNOTATION METHOD, DEVICE AND SYSTEM
- Publication number 20220414859
- Publication date Dec 29, 2022
- BOE TECHNOLOGY GROUP CO., LTD.
- Yaoping Wang
- G06 - COMPUTING CALCULATING COUNTING

Yaoping Wang

Person

Patents Grantslast 30 patents

Image annotation method, device and system

Method and device for processing product manufacturing messages, el...

Defect detection task processing method, device, apparatus and stor...

Distributed computing system for product defect analysis

Patents Applicationslast 30 patents

IMAGE RECOGNITION METHOD AND SYSTEM, AND TRAINING METHOD AND AN ELE...

METHOD AND DEVICE FOR PROCESSING PRODUCT MANUFACTURING MESSAGES, EL...

METHOD AND DEVICE FOR DETECTING DEFECT, STORAGE MEDIUM AND ELECTRON...

METHOD AND APPARATUS FOR DEVICE CONFIGURATION PARAMETER PROCESSING,...

METHOD FOR DETECTING DEFECT AND METHOD FOR TRAINING MODEL

DISTRIBUTED COMPUTING SYSTEM FOR PRODUCT DEFECT ANALYSIS

METHOD AND DEVICE FOR PROCESSING PRODUCT MANUFACTURING MESSAGES, EL...

METHOD FOR DETECTING DEFECT AND METHOD FOR TRAINING MODEL

TASK PROCESSING METHOD BASED ON DEFECT DETECTION, DEVICE, APPARATUS...

IMAGE ANNOTATION METHOD, DEVICE AND SYSTEM