Yaron Cohen

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Givat Brener, IL

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Patents Grantslast 30 patents

Information Patent Grant
Detection of weak points of a mask
- Patent number 9,299,135
- Issue date Mar 29, 2016
- Applied Materials Israel, Ltd.
- Aviram Tam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for material analysis of a microscopic element
- Patent number 8,546,756
- Issue date Oct 1, 2013
- Applied Materials Israel, Ltd.
- Dmitry Shur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process monitoring system and method for processing a large number...
- Patent number 7,587,700
- Issue date Sep 8, 2009
- Applied Materials, Israel, Ltd.
- Youval Nehmadi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DETECTION OF WEAK POINTS OF A MASK
- Publication number 20140270468
- Publication date Sep 18, 2014
- APPLIED MATERIALS ISRAEL, LTD.
- Aviram Tam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Process monitoring system and method
- Publication number 20080092088
- Publication date Apr 17, 2008
- Youval Nehmadi
- G01 - MEASURING TESTING