Yaron Ish-Shalom

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Kiryat Tivon, IL

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for measuring stress in semiconductor wafers
- Patent number 6,678,055
- Issue date Jan 13, 2004
- Tevet Process Control Technologies Ltd.
- Ofer Du-Nour
- G01 - MEASURING TESTING
Information Patent Grant
Active pyrometry with emissivity extrapolation and compensation
- Patent number 6,299,346
- Issue date Oct 9, 2001
- C. I. Systems LTD
- Yaron Ish-Shalom
- G01 - MEASURING TESTING
Information Patent Grant
Temperature measuring method and apparatus
- Patent number 6,082,892
- Issue date Jul 4, 2000
- C.I. Systems Ltd.
- Michael E. Adel
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and apparatus for measuring stress in semiconductor wafers
- Publication number 20030098704
- Publication date May 29, 2003
- Tevet Process Control Technologies Ltd.
- Ofer Du-Nour
- G01 - MEASURING TESTING