Yasuaki TSURUOKA

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Kobe-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Measurement apparatus and quality control method
- Patent number 12,228,491
- Issue date Feb 18, 2025
- Sysmex Corporation
- Hiroo Tatsutani
- G01 - MEASURING TESTING
Information Patent Grant
Measuring apparatus, measuring apparatus adjustment method and comp...
- Patent number 11,598,724
- Issue date Mar 7, 2023
- Sysmex Corporation
- Yasuaki Tsuruoka
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MEASURING APPARATUS, MEASURING APPARATUS ADJUSTMENT METHOD AND COMP...
- Publication number 20210018438
- Publication date Jan 21, 2021
- SYSMEX CORPORATION
- Yasuaki TSURUOKA
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPARATUS AND QUALITY CONTROL METHOD
- Publication number 20200103333
- Publication date Apr 2, 2020
- SYSMEX CORPORATION
- Hiroo TATSUTANI
- G01 - MEASURING TESTING