Yasuhide Inoue

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Kanagawa, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method of observation by transmission electron microscopy
- Patent number 7,083,992
- Issue date Aug 1, 2006
- Matsushita Electric Industrial Co., Ltd.
- Shinichi Ogawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method of observation by transmission electron microscopy
- Publication number 20050042781
- Publication date Feb 24, 2005
- Semiconductor Leading Edge Technologies, Inc.
- Shinichi Ogawa
- G01 - MEASURING TESTING