Yasuhide KURAMOCHI

Person

Gunma, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Measurement apparatus
- Patent number 10,436,822
- Issue date Oct 8, 2019
- Advantest Corporation
- Yasuhide Kuramochi
- G01 - MEASURING TESTING
Information Patent Grant
Measurement apparatus
- Patent number 10,228,362
- Issue date Mar 12, 2019
- Advantest Corporation
- Yasuhide Kuramochi
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Analog to digital converter and digital to analog converter
- Patent number 8,941,521
- Issue date Jan 27, 2015
- Advantest Corporation
- Yasuhide Kuramochi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Analog to digital converter and digital to analog converter
- Patent number 8,378,873
- Issue date Feb 19, 2013
- Advantest Corporation
- Yasuhide Kuramochi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Output apparatus and test apparatus
- Patent number 8,193,960
- Issue date Jun 5, 2012
- Advantest Corporation
- Yasuhide Kuramochi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Device, test apparatus and test method
- Patent number 8,179,154
- Issue date May 15, 2012
- Advantest Corporation
- Yasuhide Kuramochi
- G01 - MEASURING TESTING
Information Patent Grant
Signal generating apparatus and test apparatus
- Patent number 8,094,053
- Issue date Jan 10, 2012
- Advantest Corporation
- Yasuhide Kuramochi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Signal generating apparatus and test apparatus
- Patent number 8,081,096
- Issue date Dec 20, 2011
- Advantest Corporation
- Yasuhide Kuramochi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
A-D convert apparatus and control method
- Patent number 8,068,047
- Issue date Nov 29, 2011
- Advantest Corporation
- Yasuhide Kuramochi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Jitter measuring apparatus, jitter measuring method and test apparatus
- Patent number 8,068,538
- Issue date Nov 29, 2011
- Advantest Corporation
- Kiyotaka Ichiyama
- G01 - MEASURING TESTING
Information Patent Grant
Digital-analog converting apparatus and test apparatus
- Patent number 8,059,021
- Issue date Nov 15, 2011
- Advantest Corporation
- Yasuhide Kuramochi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Signal generating apparatus and test apparatus
- Patent number 7,982,520
- Issue date Jul 19, 2011
- Advantest Corporation
- Yasuhide Kuramochi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Output apparatus and test apparatus
- Patent number 7,978,109
- Issue date Jul 12, 2011
- Advantest Corporation
- Yasuhide Kuramochi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Jitter measuring apparatus, jitter measuring method and test apparatus
- Patent number 7,778,319
- Issue date Aug 17, 2010
- Advantest Corporation
- Kiyotaka Ichiyama
- G01 - MEASURING TESTING
Information Patent Grant
A-D convert apparatus, D-A convert apparatus and adjustment method
- Patent number 7,755,521
- Issue date Jul 13, 2010
- Advantest Corporation
- Yasuhide Kuramochi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
A-D convert apparatus
- Patent number 7,705,763
- Issue date Apr 27, 2010
- Tokyo Institute of Technology
- Yasuhide Kuramochi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
A-D convert apparatus
- Patent number 7,696,918
- Issue date Apr 13, 2010
- Tokyo Institute of Technology
- Yasuhide Kuramochi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
D-A convert apparatus and A-D convert apparatus
- Patent number 7,609,184
- Issue date Oct 27, 2009
- Advantest Corporation
- Yasuhide Kuramochi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
A-D converter and A-D convert method
- Patent number 7,605,738
- Issue date Oct 20, 2009
- Advantest Corporation
- Yasuhide Kuramochi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Comparator and A-D converter
- Patent number 7,583,218
- Issue date Sep 1, 2009
- Advantest Corporation
- Yasuhide Kuramochi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
A-D converter and A-D convert method
- Patent number 7,479,914
- Issue date Jan 20, 2009
- Advantest Corporation
- Yasuhide Kuramochi
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
A-D converter, A-D convert method, and A-D convert program
- Patent number 7,477,177
- Issue date Jan 13, 2009
- Advantest Corporation
- Yasuhide Kuramochi
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE

Patents Applicationslast 30 patents

Information Patent Application
CURRENT MEASUREMENT CIRCUIT
- Publication number 20160154032
- Publication date Jun 2, 2016
- Advantest Corporation
- Yasuhide KURAMOCHI
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPARATUS
- Publication number 20160154033
- Publication date Jun 2, 2016
- Advantest Corporation
- Yasuhide KURAMOCHI
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPARATUS
- Publication number 20160153961
- Publication date Jun 2, 2016
- Advantest Corporation
- Yasuhide KURAMOCHI
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
DA-CONVERTER AND TEST APPARATUS
- Publication number 20140028326
- Publication date Jan 30, 2014
- Masayuki KAWABATA
- G01 - MEASURING TESTING
Information Patent Application
ANALOG TO DIGITAL CONVERTER AND DIGITAL TO ANALOG CONVERTER
- Publication number 20130141266
- Publication date Jun 6, 2013
- Advantest Corporation
- Yasuhide KURAMOCHI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
ANALOG TO DIGITAL CONVERTER AND DIGITAL TO ANALOG CONVERTER
- Publication number 20120262321
- Publication date Oct 18, 2012
- Advantest Corporation
- Yasuhide KURAMOCHI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SAMPLING APPARATUS AND TEST APPARATUS
- Publication number 20120176143
- Publication date Jul 12, 2012
- Advantest Corporation
- Masayuki KAWABATA
- G01 - MEASURING TESTING
Information Patent Application
OUTPUT APPARATUS AND TEST APPARATUS
- Publication number 20110193733
- Publication date Aug 11, 2011
- Advantest Corporation
- Yasuhide KURAMOCHI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
MEASUREMENT APPARATUS AND TEST APPARATUS
- Publication number 20110181298
- Publication date Jul 28, 2011
- Advantest Corporation
- Yasuhide KURAMOCHI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
A-D convert apparatus and control method
- Publication number 20110169674
- Publication date Jul 14, 2011
- Advantest Corporation
- Yasuhide KURAMOCHI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SIGNAL GENERATING APPARATUS AND TEST APPARATUS
- Publication number 20110148499
- Publication date Jun 23, 2011
- Advantest Corporation
- Yasuhide KURAMOCHI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DIGITAL-ANALOG CONVERTING APPARATUS AND TEST APPARATUS
- Publication number 20110148680
- Publication date Jun 23, 2011
- Advantest Corporation
- Yasuhide KURAMOCHI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SIGNAL GENERATING APPARATUS AND TEST APPARATUS
- Publication number 20110140938
- Publication date Jun 16, 2011
- Advantest Corporation
- Yasuhide KURAMOCHI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SIGNAL GENERATING APPARATUS AND TEST APPARATUS
- Publication number 20110133751
- Publication date Jun 9, 2011
- Advantest Corporation
- Yasuhide KURAMOCHI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
A-D CONVERT APPARATUS, D-A CONVERT APPARATUS AND ADJUSTMENT METHOD
- Publication number 20100156689
- Publication date Jun 24, 2010
- Advantest Corporation
- YASUHIDE KURAMOCHI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DEVICE, TEST APPARATUS AND TEST METHOD
- Publication number 20100109674
- Publication date May 6, 2010
- Advantest Corporation
- YASUHIDE KURAMOCHI
- G01 - MEASURING TESTING
Information Patent Application
A-D CONVERT APPARATUS
- Publication number 20100013690
- Publication date Jan 21, 2010
- TOKYO INSTITUTE OF TECHNOLOGY
- YASUHIDE KURAMOCHI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
A-D CONVERT APPARATUS
- Publication number 20100013693
- Publication date Jan 21, 2010
- Advantest Corporation
- YASUHIDE KURAMOCHI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
D-A CONVERT APPARATUS AND A-D CONVERT APPARATUS
- Publication number 20090121907
- Publication date May 14, 2009
- Advantest Corporation
- YASUHIDE KURAMOCHI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
COMPARATOR AND A-D CONVERTER
- Publication number 20090121911
- Publication date May 14, 2009
- Advantest Corporation
- Yasuhide Kuramochi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
A-D CONVERTER AND A-D CONVERT METHOD
- Publication number 20080218393
- Publication date Sep 11, 2008
- Advantest Corporation
- YASUHIDE KURAMOCHI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
A-D converter, A-D convert method, and A-D convert program
- Publication number 20080143574
- Publication date Jun 19, 2008
- Advantest Corporation
- Yasuhide Kuramochi
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
A-D CONVERTER AND A-D CONVERT METHOD
- Publication number 20080068245
- Publication date Mar 20, 2008
- Advantest Corporation
- Yasuhide Kuramochi
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Jitter measuring apparatus, jitter measuring method and test appara...
- Publication number 20070118314
- Publication date May 24, 2007
- Kiyotaka Ichiyama
- G01 - MEASURING TESTING
Information Patent Application
Jitter measuring apparatus, jitter measuring method and test apparatus
- Publication number 20070104260
- Publication date May 10, 2007
- Kiyotaka Ichiyama
- G01 - MEASURING TESTING

Yasuhide KURAMOCHI

Person

Patents Grantslast 30 patents

Measurement apparatus

Measurement apparatus

Analog to digital converter and digital to analog converter

Analog to digital converter and digital to analog converter

Output apparatus and test apparatus

Device, test apparatus and test method

Signal generating apparatus and test apparatus

Signal generating apparatus and test apparatus

A-D convert apparatus and control method

Jitter measuring apparatus, jitter measuring method and test apparatus

Digital-analog converting apparatus and test apparatus

Signal generating apparatus and test apparatus

Output apparatus and test apparatus

Jitter measuring apparatus, jitter measuring method and test apparatus

A-D convert apparatus, D-A convert apparatus and adjustment method

A-D convert apparatus

A-D convert apparatus

D-A convert apparatus and A-D convert apparatus

A-D converter and A-D convert method

Comparator and A-D converter

A-D converter and A-D convert method

A-D converter, A-D convert method, and A-D convert program

Patents Applicationslast 30 patents

CURRENT MEASUREMENT CIRCUIT

MEASUREMENT APPARATUS

MEASUREMENT APPARATUS

DA-CONVERTER AND TEST APPARATUS

ANALOG TO DIGITAL CONVERTER AND DIGITAL TO ANALOG CONVERTER

ANALOG TO DIGITAL CONVERTER AND DIGITAL TO ANALOG CONVERTER

SAMPLING APPARATUS AND TEST APPARATUS

OUTPUT APPARATUS AND TEST APPARATUS

MEASUREMENT APPARATUS AND TEST APPARATUS

A-D convert apparatus and control method

SIGNAL GENERATING APPARATUS AND TEST APPARATUS

DIGITAL-ANALOG CONVERTING APPARATUS AND TEST APPARATUS

SIGNAL GENERATING APPARATUS AND TEST APPARATUS

SIGNAL GENERATING APPARATUS AND TEST APPARATUS

A-D CONVERT APPARATUS, D-A CONVERT APPARATUS AND ADJUSTMENT METHOD

DEVICE, TEST APPARATUS AND TEST METHOD

A-D CONVERT APPARATUS

A-D CONVERT APPARATUS

D-A CONVERT APPARATUS AND A-D CONVERT APPARATUS

COMPARATOR AND A-D CONVERTER

A-D CONVERTER AND A-D CONVERT METHOD

A-D converter, A-D convert method, and A-D convert program

A-D CONVERTER AND A-D CONVERT METHOD

Jitter measuring apparatus, jitter measuring method and test appara...

Jitter measuring apparatus, jitter measuring method and test apparatus