Yasuhide Nakai

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Hyogo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Shape measurement apparatus and shape measurement method
- Patent number 8,310,536
- Issue date Nov 13, 2012
- Kobelco Research Institute, Inc.
- Masaru Akamatsu
- G01 - MEASURING TESTING
Information Patent Grant
Shape measuring device
- Patent number 8,228,509
- Issue date Jul 24, 2012
- Kobelco Research Institute, Inc.
- Masaru Akamatsu
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for evaluating semiconductor wafers by irradia...
- Patent number 5,430,386
- Issue date Jul 4, 1995
- Leo Corporation
- Michel Morin
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SHAPE MEASURING DEVICE
- Publication number 20100302551
- Publication date Dec 2, 2010
- Masaru Akamatsu
- G01 - MEASURING TESTING
Information Patent Application
SHAPE MEASUREMENT APPARATUS AND SHAPE MEASUREMENT METHOD
- Publication number 20100134615
- Publication date Jun 3, 2010
- Masaru Akamatsu
- G01 - MEASURING TESTING