Yasuhiko NAGO

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Atsugi-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Temperature test apparatus and temperature test method
- Patent number 11,754,609
- Issue date Sep 12, 2023
- Anritsu Corporation
- Takeshi Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Temperature test apparatus and temperature test method
- Patent number 11,525,853
- Issue date Dec 13, 2022
- Anritsu Corporation
- Takeshi Kobayashi
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
TEMPERATURE TEST APPARATUS AND TEMPERATURE TEST METHOD
- Publication number 20210293869
- Publication date Sep 23, 2021
- Anritsu Corporation
- Takeshi KOBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE TEST APPARATUS AND TEMPERATURE TEST METHOD
- Publication number 20210055337
- Publication date Feb 25, 2021
- Anritsu Corporation
- Takeshi KOBAYASHI
- G05 - CONTROLLING REGULATING