Yasuhira NAGAKUBO

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Specimen holder and charged particle beam device provided with same
- Patent number 11,177,109
- Issue date Nov 16, 2021
- HITACHI HIGH-TECH CORPORATION
- Toshie Yaguchi
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Grant
Specimen holder and charged particle beam device provided with same
- Patent number 11,133,150
- Issue date Sep 28, 2021
- HITACHI HIGH-TECH CORPORATION
- Toshie Yaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cryostation system
- Patent number 10,658,150
- Issue date May 19, 2020
- Hitachi High-Technologies Corporation
- Yasuhira Nagakubo
- F25 - REFRIGERATION OR COOLING COMBINED HEATING AND REFRIGERATION SYSTEMS HEA...
Information Patent Grant
Charged particle beam device, electron microscope and sample observ...
- Patent number 10,204,761
- Issue date Feb 12, 2019
- Hitachi High-Technologies Corporation
- Takeshi Sunaoshi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope and sample observation method
- Patent number 10,083,814
- Issue date Sep 25, 2018
- Hitachi High-Technologies Corporation
- Isao Nagaoki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and sample holder for charged particle...
- Patent number 10,068,745
- Issue date Sep 4, 2018
- Hitachi High-Technologies Corporation
- Toshie Yaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample holder and charged particle device
- Patent number 9,721,752
- Issue date Aug 1, 2017
- Hitachi High-Technologies Corporation
- Yasuhira Nagakubo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample holder for electron microscope
- Patent number 9,558,910
- Issue date Jan 31, 2017
- Hitachi High-Technologies Corporation
- Shohei Terada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Specimen cryo holder and dewar
- Patent number 9,543,112
- Issue date Jan 10, 2017
- Hitachi High-Technologies Corporation
- Yasuhira Nagakubo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle radiation device and specimen preparation method u...
- Patent number 9,449,786
- Issue date Sep 20, 2016
- Hitachi High-Technologies Corporation
- Miki Tsuchiya
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Electron microscope and electron microscope sample retaining device
- Patent number 9,378,922
- Issue date Jun 28, 2016
- Hitachi High-Technologies Corporation
- Toshie Yaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle radiation apparatus, and method for displaying thr...
- Patent number 9,099,281
- Issue date Aug 4, 2015
- Hitachi High-Technologies Corporation
- Toshie Yaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Electron microscope and sample holder
- Patent number 8,878,144
- Issue date Nov 4, 2014
- Hitachi High-Technologies Corporation
- Toshie Yaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample holder, method for use of the sample holder, and charged par...
- Patent number 8,853,648
- Issue date Oct 7, 2014
- Hitachi High-Technologies Corporation
- Yasuhira Nagakubo
- G01 - MEASURING TESTING
Information Patent Grant
Sample device for charged particle beam
- Patent number 8,729,497
- Issue date May 20, 2014
- Hitachi High-Technologies Corporation
- Yasuhira Nagakubo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam device and sample holding device for electron beam de...
- Patent number 8,604,429
- Issue date Dec 10, 2013
- Hitachi High-Technologies Corporation
- Toshie Yaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fixation device for a sample case for an electron microscope
- Patent number D660335
- Issue date May 22, 2012
- Hitachi High-Technologies Corporation
- Yasuhira Nagakubo
- D16 - Photography and optical equipment
Information Patent Grant
Sample case for an electron microscope
- Patent number D651226
- Issue date Dec 27, 2011
- Hitachi High-Technologies Corporation
- Yasuhira Nagakubo
- D16 - Photography and optical equipment
Information Patent Grant
Heating stage for a micro-sample
- Patent number 7,700,927
- Issue date Apr 20, 2010
- Hitachi High-Technologies Corporation
- Yasuhira Nagakubo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nanoscale standard sample and its manufacturing method
- Patent number 6,972,405
- Issue date Dec 6, 2005
- Hitachi High-Technologies Corporation
- Yasuhira Nagakubo
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Specimen Holder and Charged Particle Beam Device Provided with Same
- Publication number 20190180978
- Publication date Jun 13, 2019
- Hitachi High-Technologies Corporation
- Toshie YAGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device, Electron Microscope and Sample Observ...
- Publication number 20170221676
- Publication date Aug 3, 2017
- Hitachi High-Technologies Corporation
- Takeshi SUNAOSHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Cryostation System
- Publication number 20170213693
- Publication date Jul 27, 2017
- Hitachi High-Technologies Corporation
- Yasuhira NAGAKUBO
- G01 - MEASURING TESTING
Information Patent Application
Charged Particle Beam Device and Sample Holder for Charged Particle...
- Publication number 20160217971
- Publication date Jul 28, 2016
- Hitachi High-Technologies Corporation
- Toshie YAGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Sample Holder and Charged Particle Device
- Publication number 20160211109
- Publication date Jul 21, 2016
- Hitachi High-Technologies Corporation
- Yasuhira NAGAKUBO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Radiation Device and Specimen Preparation Method U...
- Publication number 20160071687
- Publication date Mar 10, 2016
- Miki TSUCHIYA
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
Electron Microscope and Sample Observation Method
- Publication number 20160064183
- Publication date Mar 3, 2016
- Hitachi High-Technologies Corporation
- Isao NAGAOKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Specimen Cryo Holder and Dewar
- Publication number 20150340199
- Publication date Nov 26, 2015
- Hitachi High-Technologies Corporation
- Yasuhira NAGAKUBO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPE AND ELECTRON MICROSCOPE SAMPLE RETAINING DEVICE
- Publication number 20150179396
- Publication date Jun 25, 2015
- Hitachi High-Technologies Corporation
- Toshie Yaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE HOLDER FOR ELECTRON MICROSCOPE
- Publication number 20140353499
- Publication date Dec 4, 2014
- Hitachi High-Technologies Corporation
- Shohei Terada
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE DEVICE FOR CHARGED PARTICLE BEAM
- Publication number 20130193343
- Publication date Aug 1, 2013
- Yasuhira Nagakubo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPE AND SAMPLE HOLDER
- Publication number 20120305769
- Publication date Dec 6, 2012
- Hitachi High-Technologies Corporation
- Toshie Yaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Radiation Apparatus, and Method for Displaying Thr...
- Publication number 20120212583
- Publication date Aug 23, 2012
- Hitachi High-Technologies Corporation
- Toshie Yaguchi
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE HOLDER, METHOD FOR USE OF THE SAMPLE HOLDER, AND CHARGED PAR...
- Publication number 20120112064
- Publication date May 10, 2012
- Yasuhira Nagakubo
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON BEAM DEVICE AND SAMPLE HOLDING DEVICE FOR ELECTRON BEAM DE...
- Publication number 20110303845
- Publication date Dec 15, 2011
- Toshie Yaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HEATING STAGE FOR A MICRO-SAMPLE
- Publication number 20080290290
- Publication date Nov 27, 2008
- Hitachi High-Technologies Corporation
- Yasuhira NAGAKUBO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Nanoscale standard sample and its manufacturing method
- Publication number 20050017162
- Publication date Jan 27, 2005
- Yasuhira Nagakubo
- H01 - BASIC ELECTRIC ELEMENTS

Yasuhira NAGAKUBO

Person

Patents Grantslast 30 patents

Specimen holder and charged particle beam device provided with same

Specimen holder and charged particle beam device provided with same

Cryostation system

Charged particle beam device, electron microscope and sample observ...

Electron microscope and sample observation method

Charged particle beam device and sample holder for charged particle...

Sample holder and charged particle device

Sample holder for electron microscope

Specimen cryo holder and dewar

Charged particle radiation device and specimen preparation method u...

Electron microscope and electron microscope sample retaining device

Charged particle radiation apparatus, and method for displaying thr...

Electron microscope and sample holder

Sample holder, method for use of the sample holder, and charged par...

Sample device for charged particle beam

Electron beam device and sample holding device for electron beam de...

Fixation device for a sample case for an electron microscope

Sample case for an electron microscope

Heating stage for a micro-sample

Nanoscale standard sample and its manufacturing method

Patents Applicationslast 30 patents

Specimen Holder and Charged Particle Beam Device Provided with Same

Charged Particle Beam Device, Electron Microscope and Sample Observ...

Cryostation System

Charged Particle Beam Device and Sample Holder for Charged Particle...

Sample Holder and Charged Particle Device

Charged Particle Radiation Device and Specimen Preparation Method U...

Electron Microscope and Sample Observation Method

Specimen Cryo Holder and Dewar

ELECTRON MICROSCOPE AND ELECTRON MICROSCOPE SAMPLE RETAINING DEVICE

SAMPLE HOLDER FOR ELECTRON MICROSCOPE

SAMPLE DEVICE FOR CHARGED PARTICLE BEAM

ELECTRON MICROSCOPE AND SAMPLE HOLDER

Charged Particle Radiation Apparatus, and Method for Displaying Thr...

SAMPLE HOLDER, METHOD FOR USE OF THE SAMPLE HOLDER, AND CHARGED PAR...

ELECTRON BEAM DEVICE AND SAMPLE HOLDING DEVICE FOR ELECTRON BEAM DE...

HEATING STAGE FOR A MICRO-SAMPLE

Nanoscale standard sample and its manufacturing method