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Yasuhiro Fukumoto
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Tokyo, JP
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Patents Grants
last 30 patents
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Patent Grant
Automated analyzer and method of controlling automated analyzer
Patent number
11,965,903
Issue date
Apr 23, 2024
Jeol Ltd.
Kazushige Kojima
G01 - MEASURING TESTING
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Patent Grant
Apparatus and method for automated analysis
Patent number
11,175,302
Issue date
Nov 16, 2021
Jeol Ltd.
Makoto Asakura
G01 - MEASURING TESTING
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Patent Grant
Apparatus and method for automated analysis
Patent number
9,746,398
Issue date
Aug 29, 2017
Jeol Ltd.
Takashi Tamagawa
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Automated Analyzer and Method of Controlling Automated Analyzer
Publication number
20200378996
Publication date
Dec 3, 2020
JEOL Ltd.
Kazushige Kojima
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and Method for Automated Analysis
Publication number
20190331706
Publication date
Oct 31, 2019
JEOL Ltd.
Makoto Asakura
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and Method for Automated Analysis
Publication number
20150309060
Publication date
Oct 29, 2015
JEOL Ltd.
Takashi Tamagawa
G01 - MEASURING TESTING