Yasuhiro Gunji

Person

Hitachiota, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Circuit pattern inspecting apparatus, management system including c...
- Patent number 8,565,509
- Issue date Oct 22, 2013
- Hitachi High-Technologies Corporation
- Hiroyuki Takahashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam device for scanning a sample using a charged...
- Patent number 8,421,010
- Issue date Apr 16, 2013
- Hitachi High-Technologies Corporation
- Takashi Hiroi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device inspection apparatus
- Patent number 8,242,443
- Issue date Aug 14, 2012
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam apparatus
- Patent number 8,207,513
- Issue date Jun 26, 2012
- Hitachi High-Technologies Corporation
- Yuko Sasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus, and image generation method with c...
- Patent number 8,168,950
- Issue date May 1, 2012
- Hitachi High-Technologies Corporation
- Kanji Furuhashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Appearance inspection apparatus with scanning electron microscope a...
- Patent number 8,086,021
- Issue date Dec 27, 2011
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam inspection system and an image generation method for...
- Patent number 8,086,022
- Issue date Dec 27, 2011
- Hitachi High-Technologies Corporation
- Hiroshi Miyai
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method using electron beam
- Patent number 7,999,565
- Issue date Aug 16, 2011
- Hitachi High-Technologies Corporation
- Yasuhiro Gunji
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device inspection apparatus
- Patent number 7,838,828
- Issue date Nov 23, 2010
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method using electron beam
- Patent number 7,518,383
- Issue date Apr 14, 2009
- Hitachi High-Technologies Corporation
- Yasuhiro Gunji
- G01 - MEASURING TESTING
Information Patent Grant
Pattern inspection method and apparatus using electron beam
- Patent number 7,439,504
- Issue date Oct 21, 2008
- Hitachi, Ltd.
- Takashi Hiroi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and automatic astigmatism adjustmen...
- Patent number 7,348,558
- Issue date Mar 25, 2008
- Hitachi, Ltd.
- Masahiro Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Inspection method and inspection apparatus using electron beam
- Patent number 7,271,385
- Issue date Sep 18, 2007
- Hitachi High-Technologies Corporation
- Yasuhiro Gunji
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam apparatus and automatic astigmatism adjustmen...
- Patent number 7,030,394
- Issue date Apr 18, 2006
- Hitachi, Ltd.
- Masahiro Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Pattern inspection method and apparatus using electron beam
- Patent number 6,940,069
- Issue date Sep 6, 2005
- Hitachi, Ltd.
- Takashi Hiroi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and automatic astigmatism adjustmen...
- Patent number 6,825,480
- Issue date Nov 30, 2004
- Hitachi, Ltd.
- Masahiro Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Map displaying method and apparatus, and navigation system having t...
- Patent number 6,714,861
- Issue date Mar 30, 2004
- Xanavi Informatics Corporation
- Mariko Okude
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Pattern inspection method and apparatus using electron beam
- Patent number 6,614,022
- Issue date Sep 2, 2003
- Hitachi, Ltd.
- Takashi Hiroi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspecting system using electron beam and inspecting method using same
- Patent number 6,486,472
- Issue date Nov 26, 2002
- Hitachi, Ltd.
- Yasuhiro Gunji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Map displaying method and apparatus, and navigation system having t...
- Patent number 6,341,254
- Issue date Jan 22, 2002
- Xanavi Informatics Corporations
- Mariko Okude
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Map displaying method and apparatus, and navigation system having t...
- Patent number 6,175,802
- Issue date Jan 16, 2001
- Xanavi Informatics Corporation
- Mariko Okude
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Navigation system furnished with means for estimating error of moun...
- Patent number 6,081,230
- Issue date Jun 27, 2000
- Xanavi Informatics Corporation
- Masatoshi Hoshino
- G01 - MEASURING TESTING
Information Patent Grant
Vehicle control system, vehicle mounting apparatus, base station ap...
- Patent number 5,926,117
- Issue date Jul 20, 1999
- Hitachi, Ltd.
- Yasuhiro Gunji
- G08 - SIGNALLING
Information Patent Grant
An improved optical branching/coupling unit for an optical fiber gy...
- Patent number 5,208,652
- Issue date May 4, 1993
- Hitachi, Ltd.
- Hisao Sonobe
- G01 - MEASURING TESTING
Information Patent Grant
Optical change-over switch utilizing ferroelectric liquid crystal m...
- Patent number 4,836,657
- Issue date Jun 6, 1989
- Hitachi, Ltd.
- Yasuhiro Gunji
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
CHARGED-PARTICLE MICROSCOPE DEVICE, AND METHOD OF CONTROLLING CHARG...
- Publication number 20120091339
- Publication date Apr 19, 2012
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CIRCUIT PATTERN INSPECTING APPARATUS, MANAGEMENT SYSTEM INCLUDING C...
- Publication number 20110255773
- Publication date Oct 20, 2011
- Hitachi High-Technologies Corporation
- Hiroyuki Takahashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20110163230
- Publication date Jul 7, 2011
- Hitachi High-Technologies Corporation
- Takashi Hiroi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE INSPECTION APPARATUS
- Publication number 20100314542
- Publication date Dec 16, 2010
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20100051806
- Publication date Mar 4, 2010
- Hitachi High-Technologies Corporation
- Yuko Sasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS FOR INSPECTING A SUBSTRATE, A METHOD OF INSPECTING A SUBS...
- Publication number 20090309022
- Publication date Dec 17, 2009
- Hitachi High-Technologies Corporation
- Yasuhiro GUNJI
- G01 - MEASURING TESTING
Information Patent Application
PATTERN INSPECTION METHOD AND INSPECTION APPARATUS
- Publication number 20090206257
- Publication date Aug 20, 2009
- Hitachi High-Technologies Corporation
- Yasuhiro GUNJI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPERANCE INSPECTION APPARATUS WITH SCANNING ELECTRON MICROSCOPE AN...
- Publication number 20090208092
- Publication date Aug 20, 2009
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS, AND IMAGE GENERATION METHOD WITH C...
- Publication number 20090134340
- Publication date May 28, 2009
- Hitachi High-Technologies Corporation
- Kanji FURUHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD USING ELECTRON BEAM
- Publication number 20090123059
- Publication date May 14, 2009
- Hitachi High-Technologies Corporation
- Yasuhiro GUNJI
- G01 - MEASURING TESTING
Information Patent Application
Electron Beam Inspection System and an Image Generation Method for...
- Publication number 20090026369
- Publication date Jan 29, 2009
- Hitachi High-Technologies Corporation
- Hiroshi MIYAI
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE INSPECTION APPARATUS
- Publication number 20080308725
- Publication date Dec 18, 2008
- Hitachi High-Technologies Corporation
- Yusuke Ominami
- G01 - MEASURING TESTING
Information Patent Application
Charged particle beam apparatus and automatic astigmatism adjustmen...
- Publication number 20060289751
- Publication date Dec 28, 2006
- Hitachi, Ltd
- Masahiro Watanabe
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD USING ELECTRON BEAM
- Publication number 20060251318
- Publication date Nov 9, 2006
- Hitachi High-Technologies Corporation
- Yasuhiro GUNJI
- G01 - MEASURING TESTING
Information Patent Application
Charged particle beam apparatus
- Publication number 20060151698
- Publication date Jul 13, 2006
- Hitachi High-Technologies Corporation
- Yuko Sasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Inspection method and inspection apparatus using electron beam
- Publication number 20060076490
- Publication date Apr 13, 2006
- Yasuhiro Gunji
- G01 - MEASURING TESTING
Information Patent Application
Charged-particle beam apparatus and method for automatically correc...
- Publication number 20060060781
- Publication date Mar 23, 2006
- Masahiro Watanabe
- B82 - NANO-TECHNOLOGY
Information Patent Application
Pattern inspection method and apparatus using electron beam
- Publication number 20050263703
- Publication date Dec 1, 2005
- Takashi Hiroi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged particle beam apparatus and automatic astigmatism adjustmen...
- Publication number 20050092930
- Publication date May 5, 2005
- Hitachi, Ltd. Incorporation
- Masahiro Watanabe
- G01 - MEASURING TESTING
Information Patent Application
Inspection method and inspection apparatus using electron beam
- Publication number 20050040331
- Publication date Feb 24, 2005
- Yasuhiro Gunji
- G01 - MEASURING TESTING
Information Patent Application
Inspection method and inspection apparatus using electron beam
- Publication number 20040026633
- Publication date Feb 12, 2004
- Yasuhiro Gunji
- G01 - MEASURING TESTING
Information Patent Application
Pattern inspection method and apparatus using electron beam
- Publication number 20040028272
- Publication date Feb 12, 2004
- Takashi Hiroi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Information display system for displaying specified location with m...
- Publication number 20040012506
- Publication date Jan 22, 2004
- Toshio Fujiwara
- G08 - SIGNALLING
Information Patent Application
Information display system for displaying specified location with m...
- Publication number 20030201914
- Publication date Oct 30, 2003
- Toshio Fujiwara
- G08 - SIGNALLING
Information Patent Application
Charged-particle beam apparatus and method for automatically correc...
- Publication number 20030006371
- Publication date Jan 9, 2003
- Masahiro Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTING SYSTEM USING ELECTRON BEAM AND INSPECTING METHOD USING SAME
- Publication number 20020117619
- Publication date Aug 29, 2002
- Yasuhiro Gunji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Map displaying method and apparatus, and navigation system having t...
- Publication number 20020038181
- Publication date Mar 28, 2002
- XANAVI INFORMATICS CORPORATION
- Mariko Okude
- G01 - MEASURING TESTING
Information Patent Application
Pattern inspection method and apparatus using electron beam
- Publication number 20020030166
- Publication date Mar 14, 2002
- Takashi Hiroi
- H01 - BASIC ELECTRIC ELEMENTS

Yasuhiro Gunji

Person

Patents Grantslast 30 patents

Circuit pattern inspecting apparatus, management system including c...

Charged particle beam device for scanning a sample using a charged...

Semiconductor device inspection apparatus

Charged particle beam apparatus

Charged particle beam apparatus, and image generation method with c...

Appearance inspection apparatus with scanning electron microscope a...

Electron beam inspection system and an image generation method for...

Inspection apparatus and inspection method using electron beam

Semiconductor device inspection apparatus

Inspection apparatus and inspection method using electron beam

Pattern inspection method and apparatus using electron beam

Charged particle beam apparatus and automatic astigmatism adjustmen...

Inspection method and inspection apparatus using electron beam

Charged particle beam apparatus and automatic astigmatism adjustmen...

Pattern inspection method and apparatus using electron beam

Charged particle beam apparatus and automatic astigmatism adjustmen...

Map displaying method and apparatus, and navigation system having t...

Pattern inspection method and apparatus using electron beam

Inspecting system using electron beam and inspecting method using same

Map displaying method and apparatus, and navigation system having t...

Map displaying method and apparatus, and navigation system having t...

Navigation system furnished with means for estimating error of moun...

Vehicle control system, vehicle mounting apparatus, base station ap...

An improved optical branching/coupling unit for an optical fiber gy...

Optical change-over switch utilizing ferroelectric liquid crystal m...

Patents Applicationslast 30 patents

CHARGED-PARTICLE MICROSCOPE DEVICE, AND METHOD OF CONTROLLING CHARG...

CIRCUIT PATTERN INSPECTING APPARATUS, MANAGEMENT SYSTEM INCLUDING C...

CHARGED PARTICLE BEAM DEVICE

SEMICONDUCTOR DEVICE INSPECTION APPARATUS

CHARGED PARTICLE BEAM APPARATUS

APPARATUS FOR INSPECTING A SUBSTRATE, A METHOD OF INSPECTING A SUBS...

PATTERN INSPECTION METHOD AND INSPECTION APPARATUS

APPERANCE INSPECTION APPARATUS WITH SCANNING ELECTRON MICROSCOPE AN...

CHARGED PARTICLE BEAM APPARATUS, AND IMAGE GENERATION METHOD WITH C...

INSPECTION APPARATUS AND INSPECTION METHOD USING ELECTRON BEAM

Electron Beam Inspection System and an Image Generation Method for...

SEMICONDUCTOR DEVICE INSPECTION APPARATUS

Charged particle beam apparatus and automatic astigmatism adjustmen...

INSPECTION APPARATUS AND INSPECTION METHOD USING ELECTRON BEAM

Charged particle beam apparatus

Inspection method and inspection apparatus using electron beam

Charged-particle beam apparatus and method for automatically correc...

Pattern inspection method and apparatus using electron beam

Charged particle beam apparatus and automatic astigmatism adjustmen...

Inspection method and inspection apparatus using electron beam

Inspection method and inspection apparatus using electron beam

Pattern inspection method and apparatus using electron beam

Information display system for displaying specified location with m...

Information display system for displaying specified location with m...

Charged-particle beam apparatus and method for automatically correc...

INSPECTING SYSTEM USING ELECTRON BEAM AND INSPECTING METHOD USING SAME

Map displaying method and apparatus, and navigation system having t...

Pattern inspection method and apparatus using electron beam