Membership
Tour
Register
Log in
Yasuhiro KANAMARU
Follow
Person
Yokohama, JP
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Semiconductor device comprising a memory cell group having a gate w...
Patent number
8,576,634
Issue date
Nov 5, 2013
Renesas Electronics Corporation
Fumitoshi Ito
G11 - INFORMATION STORAGE
Information
Patent Grant
Reduced resistance thermal flow measurement device
Patent number
7,721,599
Issue date
May 25, 2010
Hitachi, Ltd.
Masahiro Matsumoto
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device
Patent number
7,719,052
Issue date
May 18, 2010
Renesas Technology Corp.
Fumitoshi Ito
G11 - INFORMATION STORAGE
Information
Patent Grant
Thermal type flow rate measuring apparatus having decrease in coupl...
Patent number
7,617,723
Issue date
Nov 17, 2009
Hitachi, Ltd.
Masahiro Matsumoto
G01 - MEASURING TESTING
Information
Patent Grant
Thermal gas flow and control device for internal-combustion engine...
Patent number
7,472,591
Issue date
Jan 6, 2009
Hitachi, Ltd.
Yasuhiro Kanamaru
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device
Patent number
7,349,250
Issue date
Mar 25, 2008
Renesas Technology Corp.
Fumitoshi Ito
G11 - INFORMATION STORAGE
Information
Patent Grant
Semiconductor device and a method of manufacturing the same
Patent number
7,087,955
Issue date
Aug 8, 2006
Renesas Technology Corp.
Yoshiyuki Kawashima
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
SEMICONDUCTOR DEVICE
Publication number
20100202205
Publication date
Aug 12, 2010
RENESAS TECHNOLOGY CORP.
Fumitoshi Ito
G11 - INFORMATION STORAGE
Information
Patent Application
Thermal Flow Measurement Device
Publication number
20090000372
Publication date
Jan 1, 2009
Masahiro Matsumoto
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR DEVICE
Publication number
20080151629
Publication date
Jun 26, 2008
Fumitoshi ITO
G11 - INFORMATION STORAGE
Information
Patent Application
Thermal Gas Flow Sensor and Control Device for Internal-Combustion...
Publication number
20080047341
Publication date
Feb 28, 2008
Hitachi, Ltd
Yasuhiro KANAMARU
G01 - MEASURING TESTING
Information
Patent Application
THERMAL TYPE FLOW RATE MEASURING APPARATUS
Publication number
20080016958
Publication date
Jan 24, 2008
Masahiro Matsumoto
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor device
Publication number
20060077713
Publication date
Apr 13, 2006
RENESAS TECHNOLOGY CORP.
Fumitoshi Ito
G11 - INFORMATION STORAGE
Information
Patent Application
Semiconductor device and a method of manufacturing the same
Publication number
20040188753
Publication date
Sep 30, 2004
Yoshiyuki Kawashima
H01 - BASIC ELECTRIC ELEMENTS