Yasuhiro Kawata

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Gyoda, JP

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Patents Grantslast 30 patents

Information Patent Grant
Memory testing method and memory testing apparatus
- Patent number 6,877,118
- Issue date Apr 5, 2005
- Advantest Corporation
- Hiromi Oshima
- G11 - INFORMATION STORAGE
Information Patent Grant
Fail address analysis and repair system for semiconductor test
- Patent number 5,841,783
- Issue date Nov 24, 1998
- Advantest Corporation
- Toshikazu Suzuki
- G11 - INFORMATION STORAGE
Information Patent Grant
Testing device for concurrently testing a plurality of semiconducto...
- Patent number 5,604,756
- Issue date Feb 18, 1997
- Advantest Corporation
- Yasuhiro Kawata
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Memory testing method and memory testing apparatus
- Publication number 20010052093
- Publication date Dec 13, 2001
- Japan Aviation Electronics Industry Limited
- Hiromi Oshima
- G11 - INFORMATION STORAGE