Yasuhiro Kishikawa

Person

Utsunomiya-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Exposure apparatus and device manufacturing method using original w...
- Patent number 9,164,370
- Issue date Oct 20, 2015
- Canon Kabushiki Kaisha
- Yasuhiro Kishikawa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Exposure apparatus
- Patent number 7,733,461
- Issue date Jun 8, 2010
- Canon Kabushiki Kaisha
- Yasuhiro Kishikawa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for measuring birefringence
- Patent number 7,286,226
- Issue date Oct 23, 2007
- Canon Kabushiki Kaisha
- Seiji Takeuchi
- G01 - MEASURING TESTING
Information Patent Grant
Birefringence measurement apparatus, strain remover, polarimeter an...
- Patent number 7,251,029
- Issue date Jul 31, 2007
- Canon Kabushiki Kaisha
- Yasuhiro Kishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Polarization state detecting system, light source, and exposure app...
- Patent number 7,180,051
- Issue date Feb 20, 2007
- Canon Kabushiki Kaisha
- Seiji Takeuchi
- G01 - MEASURING TESTING
Information Patent Grant
Beam splitting apparatus, transmittance measurement apparatus, and...
- Patent number 7,161,675
- Issue date Jan 9, 2007
- Canon Kabushiki Kaisha
- Yasuhiro Kishikawa
- G02 - OPTICS
Information Patent Grant
Beam splitting apparatus, transmittance measurement apparatus, and...
- Patent number 7,095,497
- Issue date Aug 22, 2006
- Canon Kabushiki Kaisha
- Yasuhiro Kishikawa
- G02 - OPTICS
Information Patent Grant
Exposure apparatus that acquires information regarding a polarizati...
- Patent number 7,015,456
- Issue date Mar 21, 2006
- Canon Kabushiki Kaisha
- Seiji Takeuchi
- G01 - MEASURING TESTING
Information Patent Grant
Beam splitting apparatus, transmittance measurement apparatus, and...
- Patent number 6,992,763
- Issue date Jan 31, 2006
- Canon Kabushiki Kaisha
- Yasuhiro Kishikawa
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
EXPOSURE APPARATUS AND DEVICE MANUFACTURING METHOD
- Publication number 20090257039
- Publication date Oct 15, 2009
- Canon Kabushiki Kaisha
- Yasuhiro Kishikawa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Exposure apparatus
- Publication number 20060290912
- Publication date Dec 28, 2006
- Canon Kabushiki Kaisha
- Yasuhiro Kishikawa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Polarization state detecting system, light source, and exposure app...
- Publication number 20060033019
- Publication date Feb 16, 2006
- Canon Kabushiki Kaisha
- Seiji Takeuchi
- G01 - MEASURING TESTING
Information Patent Application
Exposure apparatus and method
- Publication number 20050185155
- Publication date Aug 25, 2005
- Yasuhiro Kishikawa
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Beam splitting apparatus, transmittance measurement apparatus, and...
- Publication number 20040223228
- Publication date Nov 11, 2004
- Yasuhiro Kishikawa
- G02 - OPTICS
Information Patent Application
Beam splitting apparatus, transmittance measurement apparatus, and...
- Publication number 20040223443
- Publication date Nov 11, 2004
- Yasuhiro Kishikawa
- G02 - OPTICS
Information Patent Application
Method and apparatus for measuring birefringence
- Publication number 20040156051
- Publication date Aug 12, 2004
- Canon Kabushiki Kaisha
- Seiji Takeuchi
- G01 - MEASURING TESTING
Information Patent Application
Birefringence measurement apparatus, strain remover, polarimeter an...
- Publication number 20040008348
- Publication date Jan 15, 2004
- Yasuhiro Kishikawa
- G01 - MEASURING TESTING
Information Patent Application
Polarization state detecting system, light source, and exposure app...
- Publication number 20030234348
- Publication date Dec 25, 2003
- Canon Kabushiki Kaisha
- Seiji Takeuchi
- G01 - MEASURING TESTING
Information Patent Application
Beam splitting apparatus, transmittance measurement apparatus, and...
- Publication number 20030043376
- Publication date Mar 6, 2003
- Yasuhiro Kishikawa
- G02 - OPTICS

Yasuhiro Kishikawa

Person

Patents Grantslast 30 patents

Exposure apparatus and device manufacturing method using original w...

Exposure apparatus

Method and apparatus for measuring birefringence

Birefringence measurement apparatus, strain remover, polarimeter an...

Polarization state detecting system, light source, and exposure app...

Beam splitting apparatus, transmittance measurement apparatus, and...

Beam splitting apparatus, transmittance measurement apparatus, and...

Exposure apparatus that acquires information regarding a polarizati...

Beam splitting apparatus, transmittance measurement apparatus, and...

Patents Applicationslast 30 patents

EXPOSURE APPARATUS AND DEVICE MANUFACTURING METHOD

Exposure apparatus

Polarization state detecting system, light source, and exposure app...

Exposure apparatus and method

Beam splitting apparatus, transmittance measurement apparatus, and...

Beam splitting apparatus, transmittance measurement apparatus, and...

Method and apparatus for measuring birefringence

Birefringence measurement apparatus, strain remover, polarimeter an...

Polarization state detecting system, light source, and exposure app...

Beam splitting apparatus, transmittance measurement apparatus, and...