Yasuhiro Maeda

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method for manufacturing a probe card
- Patent number 7,243,410
- Issue date Jul 17, 2007
- Advantest Corporation
- Koichi Wada
- G01 - MEASURING TESTING
Information Patent Grant
Probe module and a testing apparatus
- Patent number 6,937,040
- Issue date Aug 30, 2005
- Advantest Corporation
- Yasuhiro Maeda
- G01 - MEASURING TESTING
Information Patent Grant
Transformer for gas insulated electric apparatus
- Patent number 6,717,499
- Issue date Apr 6, 2004
- Mitsubishi Denki Kabushiki Kaisha
- Yasuhiro Maeda
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Three-phase current transformer
- Patent number 6,680,665
- Issue date Jan 20, 2004
- Mitsubishi Denki Kabushiki Kaisha
- Hirohide Aoki
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Failure determining apparatus of gas-insulated electrical appliance
- Patent number 6,661,234
- Issue date Dec 9, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Kuniaki Nakashima
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Method and apparatus for environmental monitoring
- Patent number 6,657,196
- Issue date Dec 2, 2003
- Advantest Corp.
- Michiaki Endo
- G01 - MEASURING TESTING
Information Patent Grant
Integrated microcontact pin and method for manufacturing the same
- Patent number 6,590,479
- Issue date Jul 8, 2003
- Advantest Corporation
- Haruo Yoshida
- G01 - MEASURING TESTING
Information Patent Grant
Substrate treating method and apparatus
- Patent number 6,508,990
- Issue date Jan 21, 2003
- Advantest Corp.
- Haruo Yoshida
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Surface state monitoring method and apparatus
- Patent number 6,476,393
- Issue date Nov 5, 2002
- Advantest Corp.
- Haruo Yoshida
- G01 - MEASURING TESTING
Information Patent Grant
Surface state monitoring method and apparatus
- Patent number 6,433,339
- Issue date Aug 13, 2002
- Advantest Corp.
- Yasuhiro Maeda
- G01 - MEASURING TESTING
Information Patent Grant
Method for fabricating integrated circuit (IC) dies with multi-laye...
- Patent number 6,423,558
- Issue date Jul 23, 2002
- Advantest Corporation
- Yasuhiro Maeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gas insulated switching device
- Patent number 6,424,059
- Issue date Jul 23, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Hirohide Aoki
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Apparatus for continuous growth of SiC single crystal from SiC synt...
- Patent number 5,288,326
- Issue date Feb 22, 1994
- Nisshin Steel Co., Ltd.
- Yasuhiro Maeda
- C30 - CRYSTAL GROWTH

Patents Applicationslast 30 patents

Information Patent Application
ELECTRODE CHIP FOR DETECTING BIOLOGICAL MOLECULE, AND METHOD FOR DE...
- Publication number 20140124383
- Publication date May 8, 2014
- Yuji Miyahara
- G01 - MEASURING TESTING
Information Patent Application
Data transmission apparatus, data transmission method, data transmi...
- Publication number 20060083261
- Publication date Apr 20, 2006
- Yasuhiro Maeda
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Probe module and a testing apparatus
- Publication number 20040212379
- Publication date Oct 28, 2004
- Yasuhiro Maeda
- G01 - MEASURING TESTING
Information Patent Application
Method for manufacturing a probe card
- Publication number 20040155009
- Publication date Aug 12, 2004
- Koichi Wada
- G01 - MEASURING TESTING
Information Patent Application
Transformer for gas insulated electric apparatus
- Publication number 20030128089
- Publication date Jul 10, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Yasuhiro Maeda
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for environmental monitoring
- Publication number 20020125433
- Publication date Sep 12, 2002
- Michiaki Endo
- G01 - MEASURING TESTING
Information Patent Application
Three-phase current transformer
- Publication number 20020125978
- Publication date Sep 12, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Hirohide Aoki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Integrated microcontact pin and method for manufacturing the same
- Publication number 20010054510
- Publication date Dec 27, 2001
- Haruo Yoshida
- G01 - MEASURING TESTING
Information Patent Application
Failure determining apparatus of gas-insulated electrical appliance
- Publication number 20010017262
- Publication date Aug 30, 2001
- Kuniaki Nakashima
- G01 - MEASURING TESTING

Yasuhiro Maeda

Person

Patents Grantslast 30 patents

Method for manufacturing a probe card

Probe module and a testing apparatus

Transformer for gas insulated electric apparatus

Three-phase current transformer

Failure determining apparatus of gas-insulated electrical appliance

Method and apparatus for environmental monitoring

Integrated microcontact pin and method for manufacturing the same

Substrate treating method and apparatus

Surface state monitoring method and apparatus

Surface state monitoring method and apparatus

Method for fabricating integrated circuit (IC) dies with multi-laye...

Gas insulated switching device

Apparatus for continuous growth of SiC single crystal from SiC synt...

Patents Applicationslast 30 patents

ELECTRODE CHIP FOR DETECTING BIOLOGICAL MOLECULE, AND METHOD FOR DE...

Data transmission apparatus, data transmission method, data transmi...

Probe module and a testing apparatus

Method for manufacturing a probe card

Transformer for gas insulated electric apparatus

Method and apparatus for environmental monitoring

Three-phase current transformer

Integrated microcontact pin and method for manufacturing the same

Failure determining apparatus of gas-insulated electrical appliance