Membership
Tour
Register
Log in
Yasuhiro Motoyama
Follow
Person
Tokyo, JP
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Manufacturing method of semiconductor integrated circuit device
Patent number
8,357,933
Issue date
Jan 22, 2013
Renesas Electronics Corporation
Akio Hasebe
G01 - MEASURING TESTING
Information
Patent Grant
Method of manufacturing semiconductor integrated circuit device
Patent number
8,323,992
Issue date
Dec 4, 2012
Renesas Electronics Corporation
Seigo Nakamura
G01 - MEASURING TESTING
Information
Patent Grant
Method of manufacturing a semiconductor integrated circuit device a...
Patent number
8,206,997
Issue date
Jun 26, 2012
Renesas Electronics Corporation
Akio Hasebe
G01 - MEASURING TESTING
Information
Patent Grant
Method of manufacturing a semiconductor integrated circuit device a...
Patent number
8,062,911
Issue date
Nov 22, 2011
Renesas Electronics Corporation
Akio Hasebe
G01 - MEASURING TESTING
Information
Patent Grant
Fabrication method of semiconductor integrated circuit device
Patent number
7,901,958
Issue date
Mar 8, 2011
Renesas Electronics Corporation
Masayoshi Okamoto
G01 - MEASURING TESTING
Information
Patent Grant
Manufacturing method of semiconductor integrated circuit device
Patent number
7,776,626
Issue date
Aug 17, 2010
Renesas Technology Corp.
Akio Hasebe
G01 - MEASURING TESTING
Information
Patent Grant
Fabrication method of semiconductor integrated circuit device and p...
Patent number
7,688,086
Issue date
Mar 30, 2010
Renesas Technology Corp.
Yasuhiro Motoyama
G01 - MEASURING TESTING
Information
Patent Grant
Manufacturing method of semiconductor integrated circuit device
Patent number
7,598,100
Issue date
Oct 6, 2009
Renesas Technology Corp.
Hideyuki Matsumoto
G01 - MEASURING TESTING
Information
Patent Grant
Method of manufacturing a semiconductor integrated circuit device
Patent number
7,537,943
Issue date
May 26, 2009
Renesas Technology Corp.
Akio Hasebe
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Manufacturing method of semiconductor integrated circuit device and...
Patent number
7,517,707
Issue date
Apr 14, 2009
Renesas Technology Corp.
Masayoshi Okamoto
G01 - MEASURING TESTING
Information
Patent Grant
Manufacturing method of semiconductor integrated circuit device
Patent number
7,407,823
Issue date
Aug 5, 2008
Renesas Technology Corp.
Akio Hasebe
G01 - MEASURING TESTING
Information
Patent Grant
Fabrication method of semiconductor integrated circuit device
Patent number
7,351,597
Issue date
Apr 1, 2008
Renesas Technology Corp.
Yuji Wada
G01 - MEASURING TESTING
Information
Patent Grant
Manufacturing method of semiconductor integrated circuit device and...
Patent number
7,271,015
Issue date
Sep 18, 2007
Renesas Technology Corp.
Masayoshi Okamoto
G01 - MEASURING TESTING
Information
Patent Grant
Fabrication method of semiconductor integrated circuit device
Patent number
7,235,413
Issue date
Jun 26, 2007
Renesas Technology Corp.
Akio Hasebe
G01 - MEASURING TESTING
Information
Patent Grant
Fabrication method of semiconductor integrated circuit device
Patent number
7,219,422
Issue date
May 22, 2007
Renesas Technology Corp.
Yuji Wada
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device and manufacturing method thereof including a p...
Patent number
7,198,962
Issue date
Apr 3, 2007
Hitachi, Ltd.
Ryuji Kohno
G01 - MEASURING TESTING
Information
Patent Grant
Fabrication method of semiconductor integrated circuit device and i...
Patent number
6,696,849
Issue date
Feb 24, 2004
Renesas Technology Corporation
Naoto Ban
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device and manufacturing method thereof including a p...
Patent number
6,566,150
Issue date
May 20, 2003
Hitachi, Ltd.
Ryuji Kohno
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device and manufacturing method thereof including a p...
Patent number
6,455,335
Issue date
Sep 24, 2002
Hitachi, Ltd.
Ryuji Kohno
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device and manufacturing method thereof including a p...
Patent number
6,197,603
Issue date
Mar 6, 2001
Hitachi, Ltd.
Ryuji Kohno
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD OF MANUFACTURING SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
Publication number
20120064646
Publication date
Mar 15, 2012
Renesas Electronics Corporation
Seigo NAKAMURA
G01 - MEASURING TESTING
Information
Patent Application
FABRICATION METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
Publication number
20110175634
Publication date
Jul 21, 2011
Masayoshi Okamoto
G01 - MEASURING TESTING
Information
Patent Application
FABRICATION METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
Publication number
20110136272
Publication date
Jun 9, 2011
Masayoshi Okamoto
G01 - MEASURING TESTING
Information
Patent Application
FABRICATION METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
Publication number
20100304510
Publication date
Dec 2, 2010
Masayoshi Okamoto
G01 - MEASURING TESTING
Information
Patent Application
MANUFACTORING METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
Publication number
20100277192
Publication date
Nov 4, 2010
Renesas Technology Corp.
Akio HASEBE
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF MANUFACTURING A SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE A...
Publication number
20100279502
Publication date
Nov 4, 2010
RENESAS TECHNOLOGY CORP.
Akio Hasebe
G01 - MEASURING TESTING
Information
Patent Application
MANUFACTURING METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
Publication number
20090130785
Publication date
May 21, 2009
Hideyuki Matsumoto
G01 - MEASURING TESTING
Information
Patent Application
MANUFACTURING METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
Publication number
20090017565
Publication date
Jan 15, 2009
Akio Hasebe
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF MANUFACTURING A SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE A...
Publication number
20080160657
Publication date
Jul 3, 2008
Akio Hasebe
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF MANUFACTURING A SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
Publication number
20080096295
Publication date
Apr 24, 2008
Akio HASEBE
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
FABRICATION METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
Publication number
20080020498
Publication date
Jan 24, 2008
Masayoshi Okamoto
G01 - MEASURING TESTING
Information
Patent Application
FABRICATION METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
Publication number
20070218572
Publication date
Sep 20, 2007
Yuji Wada
G01 - MEASURING TESTING
Information
Patent Application
FABRICATION METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
Publication number
20070207559
Publication date
Sep 6, 2007
Akio Hasebe
G01 - MEASURING TESTING
Information
Patent Application
Manufacturing method of semiconductor integrated circuit device and...
Publication number
20070190671
Publication date
Aug 16, 2007
Masayoshi Okamoto
G01 - MEASURING TESTING
Information
Patent Application
FABRICATION METHOD OF SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND P...
Publication number
20070108997
Publication date
May 17, 2007
RENESAS TECHNOLOGY CORP.
Yasuhiro Motoyama
G01 - MEASURING TESTING
Information
Patent Application
Manufacturing method of semiconductor integrated circuit device
Publication number
20060286715
Publication date
Dec 21, 2006
Akio Hasebe
G01 - MEASURING TESTING
Information
Patent Application
Manufacturing method of semiconductor integrated circuit device and...
Publication number
20050227383
Publication date
Oct 13, 2005
Masayoshi Okamoto
G01 - MEASURING TESTING
Information
Patent Application
Fabrication method of semiconductor integrated circuit device
Publication number
20050095734
Publication date
May 5, 2005
Akio Hasebe
G01 - MEASURING TESTING
Information
Patent Application
Fabrication method of semiconductor integrated circuit device
Publication number
20050093565
Publication date
May 5, 2005
Masayoshi Okamoto
G01 - MEASURING TESTING
Information
Patent Application
Fabrication method of semiconductor integrated circuit device
Publication number
20040183556
Publication date
Sep 23, 2004
Yuji Wada
G01 - MEASURING TESTING
Information
Patent Application
Fabrication method of semiconductor integrated circuit device and i...
Publication number
20040135593
Publication date
Jul 15, 2004
Naoto Ban
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor device and manufacturing method thereof including a p...
Publication number
20030203521
Publication date
Oct 30, 2003
Ryuji Kohno
G01 - MEASURING TESTING
Information
Patent Application
Fabrication method of semiconductor integrated circuit device and i...
Publication number
20020039802
Publication date
Apr 4, 2002
Naoto Ban
G01 - MEASURING TESTING