Yasuhiro MURATA

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Yamanashi, JP

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Patents Applicationslast 30 patents

Information Patent Application
INSPECTION METHOD AND INSPECTION DEVICE
- Publication number 20250208169
- Publication date Jun 26, 2025
- TOKYO ELECTRON LIMITED
- Kentaro KONISHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEMPERATURE CALIBRATION SYSTEM, INSPECTION APPARATUS, AND TEMPERATU...
- Publication number 20240402021
- Publication date Dec 5, 2024
- TOKYO ELECTRON LIMITED
- Tomohiro OTA
- G01 - MEASURING TESTING