YASUHIRO OHNISHI

Person

KYOTO, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Inter-reflection detection apparatus and inter-reflection detection...
- Patent number 11,441,896
- Issue date Sep 13, 2022
- Omron Corporation
- Yasuhiro Ohnishi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Three-dimensional measurement apparatus, three-dimensional measurem...
- Patent number 11,321,860
- Issue date May 3, 2022
- Omron Corporation
- Shinya Matsumoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Three-dimensional measurement system and three-dimensional measurem...
- Patent number 11,302,022
- Issue date Apr 12, 2022
- Omron Corporation
- Yasuhiro Ohnishi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Three-dimensional shape measurement device, three-dimensional shape...
- Patent number 11,055,863
- Issue date Jul 6, 2021
- Omron Corporation
- Kennosuke Hayashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Three-dimensional-shape measurement device, three-dimensional-shape...
- Patent number 10,997,738
- Issue date May 4, 2021
- Omron Corporation
- Yasuhiro Ohnishi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image processing device, method for controlling same, program, and...
- Patent number 9,752,994
- Issue date Sep 5, 2017
- Omron Corporation
- Takeshi Kojima
- G01 - MEASURING TESTING
Information Patent Grant
Profilometer, measuring apparatus, and observing apparatus
- Patent number 8,717,578
- Issue date May 6, 2014
- Omron Corporation
- Yasuhiro Ohnishi
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for inspecting surface state
- Patent number 8,615,125
- Issue date Dec 24, 2013
- Omron Corporation
- Yasumoto Mori
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Shape measurement apparatus and calibration method
- Patent number 8,363,929
- Issue date Jan 29, 2013
- Omron Corporation
- Takeshi Kojima
- G01 - MEASURING TESTING
Information Patent Grant
Shape measuring apparatus and shape measuring method
- Patent number 8,334,985
- Issue date Dec 18, 2012
- Omron Corporation
- To Sho
- G01 - MEASURING TESTING
Information Patent Grant
Phosphate compound and preparation process thereof, phosphate coppe...
- Patent number 6,410,613
- Issue date Jun 25, 2002
- Kureha Kagaku Kogyo Kabushiki Kaisha
- Yasuhiro Ohnishi
- C07 - ORGANIC CHEMISTRY

Patents Applicationslast 30 patents

Information Patent Application
INFORMATION PROCESSING SYSTEM, INFORMATION PROCESSING METHOD, AND P...
- Publication number 20240257373
- Publication date Aug 1, 2024
- Omron Corporation
- Yosuke NARUSE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
THREE-DIMENSIONAL MEASUREMENT APPARATUS, THREE-DIMENSIONAL MEASUREM...
- Publication number 20210358147
- Publication date Nov 18, 2021
- Omron Corporation
- Shinya MATSUMOTO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
THREE-DIMENSIONAL MEASUREMENT SYSTEM AND THREE-DIMENSIONAL MEASUREM...
- Publication number 20210358157
- Publication date Nov 18, 2021
- Omron Corporation
- Yasuhiro OHNISHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTER-REFLECTION DETECTION APPARATUS AND INTER-REFLECTION DETECTION...
- Publication number 20200033119
- Publication date Jan 30, 2020
- Omron Corporation
- Yasuhiro OHNISHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
THREE-DIMENSIONAL SHAPE MEASUREMENT DEVICE, THREE-DIMENSIONAL SHAPE...
- Publication number 20200020119
- Publication date Jan 16, 2020
- Omron Corporation
- Kennosuke HAYASHI
- G01 - MEASURING TESTING
Information Patent Application
THREE-DIMENSIONAL-SHAPE MEASUREMENT DEVICE, THREE-DIMENSIONAL-SHAPE...
- Publication number 20190392599
- Publication date Dec 26, 2019
- Omron Corporation
- Yasuhiro OHNISHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION APPARATUS
- Publication number 20150253129
- Publication date Sep 10, 2015
- Omron Corporation
- Yasuhiro OHNISHI
- G01 - MEASURING TESTING
Information Patent Application
IMAGE PROCESSING DEVICE, METHOD FOR CONTROLLING SAME, PROGRAM, AND...
- Publication number 20140372075
- Publication date Dec 18, 2014
- Takeshi KOJIMA
- G01 - MEASURING TESTING
Information Patent Application
SHAPE MEASURING APPARATUS AND SHAPE MEASURING METHOD
- Publication number 20120086950
- Publication date Apr 12, 2012
- Omron Corporation
- To Sho
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD FOR INSPECTING SURFACE STATE
- Publication number 20120087566
- Publication date Apr 12, 2012
- Omron Corporation
- Yasumoto Mori
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROFILOMETER, MEASURING APPARATUS, AND OBSERVING APPARATUS
- Publication number 20120044504
- Publication date Feb 23, 2012
- Omron Corporation
- Yasuhiro Ohnishi
- G01 - MEASURING TESTING
Information Patent Application
SHAPE MEASUREMENT APPARATUS AND CALIBRATION METHOD
- Publication number 20110262007
- Publication date Oct 27, 2011
- OMRON CORPORATION,
- Takeshi KOJIMA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
THREE-DIMENSIONAL MEASUREMENT APPARATUS AND METHOD
- Publication number 20110228052
- Publication date Sep 22, 2011
- Omron Corporation
- Yasuhiro Ohnishi
- G01 - MEASURING TESTING
Information Patent Application
PROFILOMETER
- Publication number 20100259746
- Publication date Oct 14, 2010
- Omron Corporation
- Yasuhiro Ohnishi
- G01 - MEASURING TESTING
Information Patent Application
PHOSPHATE COMPOUND AND PREPARATION PROCESS THEREOF, PHOSPHATE COPPE...
- Publication number 20020068778
- Publication date Jun 6, 2002
- YASUHIRO OHNISHI
- C07 - ORGANIC CHEMISTRY

YASUHIRO OHNISHI

Person

Patents Grantslast 30 patents

Inter-reflection detection apparatus and inter-reflection detection...

Three-dimensional measurement apparatus, three-dimensional measurem...

Three-dimensional measurement system and three-dimensional measurem...

Three-dimensional shape measurement device, three-dimensional shape...

Three-dimensional-shape measurement device, three-dimensional-shape...

Image processing device, method for controlling same, program, and...

Profilometer, measuring apparatus, and observing apparatus

Apparatus and method for inspecting surface state

Shape measurement apparatus and calibration method

Shape measuring apparatus and shape measuring method

Phosphate compound and preparation process thereof, phosphate coppe...

Patents Applicationslast 30 patents

INFORMATION PROCESSING SYSTEM, INFORMATION PROCESSING METHOD, AND P...

THREE-DIMENSIONAL MEASUREMENT APPARATUS, THREE-DIMENSIONAL MEASUREM...

THREE-DIMENSIONAL MEASUREMENT SYSTEM AND THREE-DIMENSIONAL MEASUREM...

INTER-REFLECTION DETECTION APPARATUS AND INTER-REFLECTION DETECTION...

THREE-DIMENSIONAL SHAPE MEASUREMENT DEVICE, THREE-DIMENSIONAL SHAPE...

THREE-DIMENSIONAL-SHAPE MEASUREMENT DEVICE, THREE-DIMENSIONAL-SHAPE...

INSPECTION APPARATUS

IMAGE PROCESSING DEVICE, METHOD FOR CONTROLLING SAME, PROGRAM, AND...

SHAPE MEASURING APPARATUS AND SHAPE MEASURING METHOD

APPARATUS AND METHOD FOR INSPECTING SURFACE STATE

PROFILOMETER, MEASURING APPARATUS, AND OBSERVING APPARATUS

SHAPE MEASUREMENT APPARATUS AND CALIBRATION METHOD

THREE-DIMENSIONAL MEASUREMENT APPARATUS AND METHOD

PROFILOMETER

PHOSPHATE COMPOUND AND PREPARATION PROCESS THEREOF, PHOSPHATE COPPE...