Yasuhiro Okumoto

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Tsuchiura, JP

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Patents Grantslast 30 patents

Information Patent Grant
Combined optical profilometry and projection microscopy of integrat...
- Patent number 6,645,824
- Issue date Nov 11, 2003
- Timbre Technologies, Inc.
- Wenge Yang
- G01 - MEASURING TESTING
Information Patent Grant
Structures and method with bitline self-aligned to vertical connection
- Patent number 6,486,518
- Issue date Nov 26, 2002
- Texas Instruments Incorporated
- Yasuhiro Okumoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Staggered-edge capacitor electrode
- Patent number 6,407,423
- Issue date Jun 18, 2002
- Texas Instruments Incorporated
- Yasuhiro Okumoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Staggered-edge capacitor electrode
- Patent number 6,373,092
- Issue date Apr 16, 2002
- Texas Instruments Incorporated
- Yasuhiro Okumoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of making a cylindrical electrode
- Patent number 5,629,225
- Issue date May 13, 1997
- Texas Instruments Incorporated
- Takashi Iwakiri
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Processing method and device
- Publication number 20070004051
- Publication date Jan 4, 2007
- Yasuhiro Okumoto
- G05 - CONTROLLING REGULATING
Information Patent Application
COMBINED OPTICAL PROFILOMETRY AND PROJECTION MICROSCOPY OF INTEGRAT...
- Publication number 20030203590
- Publication date Oct 30, 2003
- Wenge Yang
- G01 - MEASURING TESTING
Information Patent Application
Structures and method with bitline self-aligned to vertical connection
- Publication number 20030068856
- Publication date Apr 10, 2003
- Yasuhiro Okumoto
- H01 - BASIC ELECTRIC ELEMENTS