Yasuhiro Okumura

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device and semiconductor device testing method
- Patent number 6,496,433
- Issue date Dec 17, 2002
- Fujitsu Limited
- Yasuhiro Okumura
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor device and semiconductor device testing method
- Publication number 20010017802
- Publication date Aug 30, 2001
- FUJITSU LIMITED
- Yasuhiro Okumura
- G11 - INFORMATION STORAGE