Yasuhiro Onishi

Follow

Person

Kyoto-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Solder material test apparatus, and method of controlling the same
- Patent number 7,660,643
- Issue date Feb 9, 2010
- Omron Corporation
- Yasuhiro Onishi
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Solder material test method and apparatus, control program and comp...
- Patent number 7,531,801
- Issue date May 12, 2009
- Omron Corporation
- Katsumi Ohashi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Solder Material Inspecting Device
- Publication number 20090122306
- Publication date May 14, 2009
- Omron Corporation
- Katsumi Ohashi
- G01 - MEASURING TESTING
Information Patent Application
Solder material test method and apparatus, control program and comp...
- Publication number 20080156990
- Publication date Jul 3, 2008
- OMRON CORPORATION
- Katsumi Ohashi
- G01 - MEASURING TESTING
Information Patent Application
Solder material test apparatus, and method of controlling the same
- Publication number 20070046283
- Publication date Mar 1, 2007
- OMRON CORPORATION
- Yasuhiro Onishi
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR