Yasuhiro Shirasaki

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam device
- Patent number 12,125,667
- Issue date Oct 22, 2024
- HITACHI HIGH-TECH CORPORATION
- Yasuhiro Shirasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam application apparatus
- Patent number 11,915,903
- Issue date Feb 27, 2024
- HITACHI HIGH-TECH CORPORATION
- Momoyo Enyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device defect detection method using a charged particle beam
- Patent number 11,631,568
- Issue date Apr 18, 2023
- HITACHI HIGH-TECH CORPORATION
- Yasuhiro Shirasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measurement system and method for setting observation conditions of...
- Patent number 11,380,518
- Issue date Jul 5, 2022
- Hitachi, Ltd.
- Takafumi Miwa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 11,355,308
- Issue date Jun 7, 2022
- HITACHI HIGH-TECH CORPORATION
- Yasuhiro Shirasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Information processing system and information processing method
- Patent number 11,334,761
- Issue date May 17, 2022
- Hitachi, Ltd.
- Thantip Krasienapibal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam device
- Patent number 11,328,897
- Issue date May 10, 2022
- HITACHI HIGH-TECH CORPORATION
- Minami Shouji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam application apparatus
- Patent number 11,177,108
- Issue date Nov 16, 2021
- HITACHI HIGH-TECH CORPORATION
- Yasuhiro Shirasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image forming apparatus
- Patent number 10,755,396
- Issue date Aug 25, 2020
- Hitachi, Ltd.
- Momoyo Enyama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam device
- Patent number 10,651,004
- Issue date May 12, 2020
- Hitachi, Ltd.
- Yasuhiro Shirasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope and image processing apparatus
- Patent number 10,483,083
- Issue date Nov 19, 2019
- Hitachi, Ltd.
- Thantip Krasienapibal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle detector and charged particle beam device using th...
- Patent number 10,361,063
- Issue date Jul 23, 2019
- Hitachi, Ltd.
- Yasuhiro Shirasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 10,256,068
- Issue date Apr 9, 2019
- Hitachi, Ltd.
- Momoyo Enyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and aberration corrector
- Patent number 9,991,088
- Issue date Jun 5, 2018
- Hitachi, Ltd.
- Yasuhiro Shirasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method, apparatus and program for establishing encrypted communicat...
- Patent number 8,515,066
- Issue date Aug 20, 2013
- NTT Communications Corporation
- Makoto Saito
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
Charged Particle Beam System
- Publication number 20240177964
- Publication date May 30, 2024
- Hitachi High-Tech Corporation
- Heita KIMIZUKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Inspection System
- Publication number 20240029994
- Publication date Jan 25, 2024
- Hitachi High-Tech Corporation
- Natsuki TSUNO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20230377837
- Publication date Nov 23, 2023
- HITACHI HIGH-TECH CORPORATION
- Yohei NAKAMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device
- Publication number 20230274909
- Publication date Aug 31, 2023
- Hitachi High-Tech Corporation
- Minami SHOUJI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR INSPECTION DEVICE AND METHOD FOR INSPECTING SEMICONDU...
- Publication number 20230273253
- Publication date Aug 31, 2023
- HITACHI HIGH-TECH CORPORATION
- Yasuhiro SHIRASAKI
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM DEVICE AND SAMPLE OBSERVATION METHOD
- Publication number 20230253180
- Publication date Aug 10, 2023
- HITACHI HIGH-TECH CORPORATION
- Daisuke BIZEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20220328281
- Publication date Oct 13, 2022
- Hitachi High-Tech Corporation
- Yasuhiro Shirasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON BEAM APPLICATION APPARATUS
- Publication number 20220319798
- Publication date Oct 6, 2022
- HITACHI HIGH-TECH CORPORATION
- Momoyo Enyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE DEFECT DETECTION METHOD USING A CHARGED PARTICLE BEAM
- Publication number 20220108866
- Publication date Apr 7, 2022
- HITACHI HIGH-TECH CORPORATION
- Yasuhiro Shirasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Measurement System and Method for Setting Observation Conditions of...
- Publication number 20210407763
- Publication date Dec 30, 2021
- Hitachi, Ltd
- Takafumi MIWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20210066028
- Publication date Mar 4, 2021
- HITACHI HIGH-TECH CORPORATION
- Yasuhiro Shirasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20210066029
- Publication date Mar 4, 2021
- HITACHI HIGH-TECH CORPORATION
- Minami Shouji
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM APPLICATION APPARATUS
- Publication number 20210005417
- Publication date Jan 7, 2021
- Hitachi High-Tech Corporation
- Yasuhiro Shirasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INFORMATION PROCESSING SYSTEM AND INFORMATION PROCESSING METHOD
- Publication number 20200257937
- Publication date Aug 13, 2020
- Hitachi, Ltd
- Thantip KRASIENAPIBAL
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ANALYZING SYSTEM
- Publication number 20200225175
- Publication date Jul 16, 2020
- Hitachi, Ltd
- Akiko KAGATSUME
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20190131104
- Publication date May 2, 2019
- Hitachi, Ltd
- Yasuhiro SHIRASAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCANNING ELECTRON MICROSCOPE AND IMAGE PROCESSING APPARATUS
- Publication number 20190035597
- Publication date Jan 31, 2019
- Hitachi, Ltd
- Thantip KRASIENAPIBAL
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Charged Particle Detector and Charged Particle Beam Device Using th...
- Publication number 20180261425
- Publication date Sep 13, 2018
- Hitachi, Ltd
- Yasuhiro SHIRASAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGE FORMING APPARATUS
- Publication number 20180232869
- Publication date Aug 16, 2018
- Hitachi, Ltd
- Momoyo ENYAMA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20180033587
- Publication date Feb 1, 2018
- Hitachi, Ltd
- Momoyo ENYAMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device and Aberration Corrector
- Publication number 20180025886
- Publication date Jan 25, 2018
- Hitachi, Ltd
- Yasuhiro SHIRASAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NEAR-INFRARED LIGHT EMITTING DEVICE USING SEMICONDUCTOR NANOCRYSTALS
- Publication number 20140158977
- Publication date Jun 12, 2014
- Massachusetts Institute of Technology
- Geoffrey J.S. SUPRAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method, apparatus and program for establishing encrypted communicat...
- Publication number 20070133803
- Publication date Jun 14, 2007
- Makoto Saito
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Yasuhiro Shirasaki

Person

Patents Grantslast 30 patents

Charged particle beam device

Electron beam application apparatus

Device defect detection method using a charged particle beam

Measurement system and method for setting observation conditions of...

Charged particle beam device

Information processing system and information processing method

Charged particle beam device

Charged particle beam application apparatus

Image forming apparatus

Charged particle beam device

Scanning electron microscope and image processing apparatus

Charged particle detector and charged particle beam device using th...

Charged particle beam apparatus

Charged particle beam device and aberration corrector

Method, apparatus and program for establishing encrypted communicat...

Patents Applicationslast 30 patents

Charged Particle Beam System

Inspection System

CHARGED PARTICLE BEAM APPARATUS

Charged Particle Beam Device

SEMICONDUCTOR INSPECTION DEVICE AND METHOD FOR INSPECTING SEMICONDU...

CHARGED PARTICLE BEAM DEVICE AND SAMPLE OBSERVATION METHOD

CHARGED PARTICLE BEAM DEVICE

ELECTRON BEAM APPLICATION APPARATUS

DEVICE DEFECT DETECTION METHOD USING A CHARGED PARTICLE BEAM

Measurement System and Method for Setting Observation Conditions of...

CHARGED PARTICLE BEAM DEVICE

CHARGED PARTICLE BEAM DEVICE

CHARGED PARTICLE BEAM APPLICATION APPARATUS

INFORMATION PROCESSING SYSTEM AND INFORMATION PROCESSING METHOD

ANALYZING SYSTEM

CHARGED PARTICLE BEAM DEVICE

SCANNING ELECTRON MICROSCOPE AND IMAGE PROCESSING APPARATUS

Charged Particle Detector and Charged Particle Beam Device Using th...

IMAGE FORMING APPARATUS

CHARGED PARTICLE BEAM APPARATUS

Charged Particle Beam Device and Aberration Corrector

NEAR-INFRARED LIGHT EMITTING DEVICE USING SEMICONDUCTOR NANOCRYSTALS

Method, apparatus and program for establishing encrypted communicat...