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Yasuhiro Sugawara
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Hiroshima, JP
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last 30 patents
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Patent Grant
Scanning probe microscope
Patent number
6,097,197
Issue date
Aug 1, 2000
Olympus Optical Co., Ltd.
Katsuhiro Matsuyama
B82 - NANO-TECHNOLOGY
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Patent Grant
Scanning probe microscope having cantilever and detecting sample ch...
Patent number
5,289,004
Issue date
Feb 22, 1994
Olympus Optical Co., Ltd.
Takao Okada
B82 - NANO-TECHNOLOGY