Yasuhiro Takada

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Kawasaki, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor memory and burn-in test method of semiconductor memory
- Patent number 7,200,059
- Issue date Apr 3, 2007
- Fujitsu Limited
- Shinya Fujioka
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device with a detection circuit to detect word...
- Patent number 4,807,193
- Issue date Feb 21, 1989
- Fujitsu Limited
- Yoshihiro Takemae
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor integrated circuit having function for switching oper...
- Patent number 4,771,407
- Issue date Sep 13, 1988
- Fujitsu Limited
- Yoshihiro Takemae
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor memory and burn-in test method of semiconductor memory
- Publication number 20060291307
- Publication date Dec 28, 2006
- FUJITSU LIMITED
- Shinya Fujioka
- G11 - INFORMATION STORAGE