Yasuhiro Takahama

Person

Kawasaki-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Inner-wall measuring instrument and offset-amount calculation method
- Patent number 10,578,414
- Issue date Mar 3, 2020
- Mitutoyo Corporation
- Yasuhiro Takahama
- G01 - MEASURING TESTING
Information Patent Grant
Calibration method of image measuring device
- Patent number 10,551,174
- Issue date Feb 4, 2020
- Mitutoyo Corporation
- Yasuhiro Takahama
- G01 - MEASURING TESTING
Information Patent Grant
Measurement method and measurement program for calculating roughnes...
- Patent number 10,274,313
- Issue date Apr 30, 2019
- Mitutoyo Corporation
- Hiroshi Sakai
- G01 - MEASURING TESTING
Information Patent Grant
Double cone stylus, touch probe, and method of calibrating double c...
- Patent number 9,341,460
- Issue date May 17, 2016
- Mitutoyo Corporation
- Masaki Kurihara
- G01 - MEASURING TESTING
Information Patent Grant
Calibrating jig, profile measuring device, and method of offset cal...
- Patent number 8,416,426
- Issue date Apr 9, 2013
- Mitutoyo Corporation
- Masaoki Yamagata
- G01 - MEASURING TESTING
Information Patent Grant
Calibrating jig, profile measuring device, and method of offset cal...
- Patent number 8,139,229
- Issue date Mar 20, 2012
- Mitutoyo Corporation
- Masaoki Yamagata
- G01 - MEASURING TESTING
Information Patent Grant
Abnormality detecting method for form measuring mechanism and form...
- Patent number 7,882,723
- Issue date Feb 8, 2011
- Mitutoyo Corporation
- Yasuhiro Takahama
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SHAPE RECONSTRUCTION METHOD AND IMAGE MEASUREMENT DEVICE
- Publication number 20220412727
- Publication date Dec 29, 2022
- MACHINE VISION LIGHTING INC.
- Shigeki MASUMURA
- G01 - MEASURING TESTING
Information Patent Application
IMAGE MEASUREMENT APPARATUS AND COMPUTER READABLE MEDIUM
- Publication number 20190220185
- Publication date Jul 18, 2019
- Mitutoyo Corporation
- Gyokubu Cho
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CALIBRATION METHOD OF IMAGE MEASURING DEVICE
- Publication number 20190113333
- Publication date Apr 18, 2019
- MITUTOYO CORPORATION
- Yasuhiro TAKAHAMA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
MEASUREMENT METHOD AND MEASUREMENT PROGRAM
- Publication number 20170248410
- Publication date Aug 31, 2017
- MITUTOYO CORPORATION
- Hiroshi SAKAI
- G01 - MEASURING TESTING
Information Patent Application
INNER-WALL MEASURING INSTRUMENT AND OFFSET-AMOUNT CALCULATION METHOD
- Publication number 20170248399
- Publication date Aug 31, 2017
- MITUTOYO CORPORATION
- Yasuhiro TAKAHAMA
- G01 - MEASURING TESTING
Information Patent Application
DOUBLE CONE STYLUS, TOUCH PROBE, AND METHOD OF CALIBRATING DOUBLE C...
- Publication number 20140109420
- Publication date Apr 24, 2014
- MITUTOYO CORPORATION
- Masaki KURIHARA
- G01 - MEASURING TESTING
Information Patent Application
CALIBRATING JIG, PROFILE MEASURING DEVICE, AND METHOD OF OFFSET CAL...
- Publication number 20120188558
- Publication date Jul 26, 2012
- Mitutoyo Corporation
- Masaoki Yamagata
- G01 - MEASURING TESTING
Information Patent Application
Calibrating jig, profile measuring device, and method of offset cal...
- Publication number 20100007895
- Publication date Jan 14, 2010
- Mitutoyo Corporation
- Masaoki Yamagata
- G01 - MEASURING TESTING
Information Patent Application
ABNORMALITY DETECTING METHOD FOR FORM MEASURING MECHANISM AND FORM...
- Publication number 20080295571
- Publication date Dec 4, 2008
- Mitutoyo Corporation
- Yasuhiro Takahama
- G01 - MEASURING TESTING

Yasuhiro Takahama

Person

Patents Grantslast 30 patents

Inner-wall measuring instrument and offset-amount calculation method

Calibration method of image measuring device

Measurement method and measurement program for calculating roughnes...

Double cone stylus, touch probe, and method of calibrating double c...

Calibrating jig, profile measuring device, and method of offset cal...

Calibrating jig, profile measuring device, and method of offset cal...

Abnormality detecting method for form measuring mechanism and form...

Patents Applicationslast 30 patents

SHAPE RECONSTRUCTION METHOD AND IMAGE MEASUREMENT DEVICE

IMAGE MEASUREMENT APPARATUS AND COMPUTER READABLE MEDIUM

CALIBRATION METHOD OF IMAGE MEASURING DEVICE

MEASUREMENT METHOD AND MEASUREMENT PROGRAM

INNER-WALL MEASURING INSTRUMENT AND OFFSET-AMOUNT CALCULATION METHOD

DOUBLE CONE STYLUS, TOUCH PROBE, AND METHOD OF CALIBRATING DOUBLE C...

CALIBRATING JIG, PROFILE MEASURING DEVICE, AND METHOD OF OFFSET CAL...

Calibrating jig, profile measuring device, and method of offset cal...

ABNORMALITY DETECTING METHOD FOR FORM MEASURING MECHANISM AND FORM...