Yasuhiro Tokunaga

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor integrated circuit
- Patent number 8,281,158
- Issue date Oct 2, 2012
- Lapis Semiconductor Co., Ltd.
- Yasuhiro Tokunaga
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Semiconductor integrated circuit with voltage drop detector
- Patent number 7,649,373
- Issue date Jan 19, 2010
- Oki Semiconductor Co., Ltd.
- Yasuhiro Tokunaga
- G01 - MEASURING TESTING
Information Patent Grant
Temperature detection from differences in off leak currents of NMOS...
- Patent number 6,896,408
- Issue date May 24, 2005
- Oki Electric Industry Co., Ltd.
- Yasuhiro Tokunaga
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device having semiconductor memory circuit to be test...
- Patent number 6,195,771
- Issue date Feb 27, 2001
- Oki Electric Industry Co., Ltd.
- Tetsuya Tanabe
- G11 - INFORMATION STORAGE
Information Patent Grant
Dynamic random access memory with bit line equalizing means
- Patent number 5,444,662
- Issue date Aug 22, 1995
- Oki Electric Industry Co., Ltd.
- Takayuki Tanaka
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device
- Patent number 5,274,585
- Issue date Dec 28, 1993
- Oki Electric Industry Co., Ltd.
- Junichi Suyama
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor integrated circuit
- Publication number 20080297233
- Publication date Dec 4, 2008
- Oki Electric Industry Co., Ltd.
- Yasuhiro Tokunaga
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Semiconductor integrated circuit with voltage drop detector
- Publication number 20080068045
- Publication date Mar 20, 2008
- Oki Electric Industry Co., Ltd.
- Yasuhiro Tokunaga
- G01 - MEASURING TESTING