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Yasuhiro YAMASHITA
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Kanagawa, JP
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Patents Grants
last 30 patents
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Patent Grant
Mask inspection apparatus and mask inspection method
Patent number
10,488,180
Issue date
Nov 26, 2019
NuFlare Technology, Inc.
Yasuhiro Yamashita
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Inspection apparatus and inspection method
Patent number
9,036,143
Issue date
May 19, 2015
NuFlare Technology, Inc.
Yasuhiro Yamashita
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD
Publication number
20230018318
Publication date
Jan 19, 2023
NuFlare Technology, Inc.
Ryoichi HIRANO
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
IMAGE ACQUISITION METHOD AND IMAGE ACQUISITION APPARATUS
Publication number
20230009656
Publication date
Jan 12, 2023
NuFlare Technology, Inc.
Yasuhiro YAMASHITA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MASK INSPECTION APPARATUS AND MASK INSPECTION METHOD
Publication number
20160267648
Publication date
Sep 15, 2016
NuFlare Technology, Inc.
Yasuhiro YAMASHITA
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
Publication number
20140307254
Publication date
Oct 16, 2014
NuFlare Technology, Inc.
Yasuhiro YAMASHITA
G01 - MEASURING TESTING