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Yasuhisa Naitoh

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  • Tsukuba, JP
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Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    INFORMATION PROCESSING APPARATUS AND CONTROL METHOD OF INFORMATION...
    • Publication number 20240127982
    • Publication date Apr 18, 2024
    • NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
    • Hiroyuki AKINAGA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    INFORMATION PROCESSING DEVICE AND METHOD OF DRIVING INFORMATION PRO...
    • Publication number 20220407003
    • Publication date Dec 22, 2022
    • NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
    • Hisashi SHIMA
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    CONDUCTIVE BRIDGE MEMORY DEVICE, MANUFACTURING METHOD THEREOF, AND...
    • Publication number 20220254998
    • Publication date Aug 11, 2022
    • NATIONAL UNIVERSITY CORPORATION TOTTORI UNIVERSITY
    • Toshiyuki ITOH
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    VARIABLE RESISTANCE NON-VOLATILE MEMORY ELEMENT AND VARIABLE RESIST...
    • Publication number 20210320248
    • Publication date Oct 14, 2021
    • NUVOTON TECHNOLOGY CORPORATION JAPAN
    • Ryutaro YASUHARA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    THERMOELECTRIC MATERIAL AND THERMOELECTRIC MODULE
    • Publication number 20170162777
    • Publication date Jun 8, 2017
    • NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
    • Masakazu Mukaida
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    THERMOELECTRIC MATERIAL AND THERMOELECTRIC MODULE
    • Publication number 20150214457
    • Publication date Jul 30, 2015
    • National Institute of Advanced Industrial Science and Technology
    • Masakazu Mukaida
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    STORAGE ELEMENT
    • Publication number 20150123069
    • Publication date May 7, 2015
    • Funai Electric Co., Ltd.
    • Shigeo FURUTA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Switching Element
    • Publication number 20110108399
    • Publication date May 12, 2011
    • Funai Electric Advanced Applied Technology Research Institute Inc.
    • Shigeo Furuta
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Switching Element
    • Publication number 20090251199
    • Publication date Oct 8, 2009
    • NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
    • Yasuhisa Naitoh
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Drive Method of Nanogap Switching Element and Storage Apparatus Equ...
    • Publication number 20090161407
    • Publication date Jun 25, 2009
    • Funai Electric Advanced Applied Technology Research Institute Inc.
    • Yuichiro MASUDA
    • G11 - INFORMATION STORAGE
  • Information Patent Application

    Two-terminal resistance switching element with silicon, and semicon...
    • Publication number 20090039330
    • Publication date Feb 12, 2009
    • NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
    • Yasuhisa Naitoh
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Switching Element
    • Publication number 20080315184
    • Publication date Dec 25, 2008
    • Funai Electric Advanced Applied Technology Research Institute Inc.
    • Shigeo Furuta
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Non-volatile memory device
    • Publication number 20080232153
    • Publication date Sep 25, 2008
    • NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
    • Yasuhisa Naitoh
    • G11 - INFORMATION STORAGE
  • Information Patent Application

    Probe device
    • Publication number 20050139770
    • Publication date Jun 30, 2005
    • Takuya Matsumoto
    • G01 - MEASURING TESTING
  • Information Patent Application

    Probe device and method of controlling the same
    • Publication number 20050140387
    • Publication date Jun 30, 2005
    • Takuya Matsumoto
    • G01 - MEASURING TESTING