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Yasuhito Yamamoto

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  • Nirasaki-shi, JP
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Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    INSPECTION METHOD FOR INSPECTING ELECTRIC CHARACTERISTICS OF DEVICE...
    • Publication number 20110309849
    • Publication date Dec 22, 2011
    • TOKYO ELECTRON LIMITED
    • Yasuhito Yamamoto
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE APPARATUS AND SUBSTRATE TRANSFER METHOD
    • Publication number 20110107858
    • Publication date May 12, 2011
    • TOKYO ELECTRON LIMITED
    • Tadashi Obikane
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE APPARATUS, PROBING METHOD, AND STORAGE MEDIUM
    • Publication number 20090212803
    • Publication date Aug 27, 2009
    • TOKYO ELECTRON LIMITED
    • Yasuhito Yamamoto
    • G01 - MEASURING TESTING
  • Information Patent Application

    TEST DEVICE
    • Publication number 20090096475
    • Publication date Apr 16, 2009
    • TOKYO ELECTRON LIMITED
    • Yasuhito YAMAMOTO
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE APPARATUS AND PROBING METHOD
    • Publication number 20090085594
    • Publication date Apr 2, 2009
    • TOKYO ELECTRON LIMITED
    • Yasuhito Yamamoto
    • G01 - MEASURING TESTING
  • Information Patent Application

    INSPECTION APPARATUS AND INSPECTION METHOD
    • Publication number 20090058446
    • Publication date Mar 5, 2009
    • TOKYO ELECTRON LIMITED
    • Yasuhito Yamamoto
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE APPARATUS
    • Publication number 20080290886
    • Publication date Nov 27, 2008
    • TOKYO ELECTRON LIMITED
    • Shuji Akiyama
    • G01 - MEASURING TESTING
  • Information Patent Application

    INSPECTION APPARATUS
    • Publication number 20080231301
    • Publication date Sep 25, 2008
    • TOKYO ELECTRON LIMITED
    • Masaru Suzuki
    • G01 - MEASURING TESTING