Yasuji Seko

Person

Kanagawa, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Position measuring system, position measuring method and computer r...
- Patent number 8,170,329
- Issue date May 1, 2012
- Fuji Xerox Co., Ltd.
- Yasuji Seko
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Longitudinal interference fringe pattern projection lens, optical s...
- Patent number 7,830,605
- Issue date Nov 9, 2010
- Fuji Xerox Co., Ltd.
- Yasuji Seko
- G02 - OPTICS
Information Patent Grant
Position measurement system
- Patent number 7,791,736
- Issue date Sep 7, 2010
- Fuji Xerox Co., Ltd.
- Yasuji Seko
- G01 - MEASURING TESTING
Information Patent Grant
Position measurement system, position measurement method and comput...
- Patent number 7,742,895
- Issue date Jun 22, 2010
- Fuji Xerox Co., Ltd.
- Yasuji Seko
- G01 - MEASURING TESTING
Information Patent Grant
Optical lens system and position measurement system using the same
- Patent number 7,633,628
- Issue date Dec 15, 2009
- Fuji Xerox Co., Ltd.
- Yasuji Seko
- G01 - MEASURING TESTING
Information Patent Grant
Position measurement system
- Patent number 7,583,388
- Issue date Sep 1, 2009
- Fuji Xerox Co., Ltd.
- Yasuji Seko
- G01 - MEASURING TESTING
Information Patent Grant
Position measurement system
- Patent number 7,562,821
- Issue date Jul 21, 2009
- Fuji Xerox Co., Ltd.
- Yasuji Seko
- G01 - MEASURING TESTING
Information Patent Grant
Positional measurement system and lens for positional measurement
- Patent number 7,554,676
- Issue date Jun 30, 2009
- Fuji Xerox Co., Ltd.
- Yasuji Seko
- G01 - MEASURING TESTING
Information Patent Grant
Optical lens system and position measurement system using the same
- Patent number 7,489,406
- Issue date Feb 10, 2009
- Fuji Xerox Co., Ltd.
- Yasuji Seko
- G01 - MEASURING TESTING
Information Patent Grant
Position measurement system
- Patent number 7,474,418
- Issue date Jan 6, 2009
- Fuji Xerox Co., Ltd.
- Yasuji Seko
- G01 - MEASURING TESTING
Information Patent Grant
Information processing method and system using terminal apparatus
- Patent number 7,360,708
- Issue date Apr 22, 2008
- Fuji Xerox Co., Ltd.
- Hiroyuki Miyake
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical lens system and position measurement system using the same
- Patent number 7,274,461
- Issue date Sep 25, 2007
- Fuji Xerox Co., Ltd.
- Yasuji Seko
- G01 - MEASURING TESTING
Information Patent Grant
Optical position measuring system using an interference pattern
- Patent number 7,009,713
- Issue date Mar 7, 2006
- Fuji Xerox Co., Ltd.
- Yasuji Seko
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Position measurement system
- Patent number 6,985,236
- Issue date Jan 10, 2006
- Fuji Xerox Co., Ltd.
- Yasuji Seko
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device, surface emitting semiconductor laser and edge...
- Patent number 6,597,017
- Issue date Jul 22, 2003
- Fuji Xerox Co., Ltd.
- Yasuji Seko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Surface emitting semiconductor laser
- Patent number 6,320,891
- Issue date Nov 20, 2001
- Fuji Xerox Co., Ltd.
- Yasuji Seko
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Semiconductor device and image formation apparatus using same
- Patent number 6,262,540
- Issue date Jul 17, 2001
- Fuji Xerox Co., Ltd.
- Yasuji Seko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Surface emitting semiconductor laser, its producing method and surf...
- Patent number 6,222,866
- Issue date Apr 24, 2001
- Fuji Xerox Co., Ltd.
- Yasuji Seko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optoelectro transducer array, and light-emitting device array and f...
- Patent number 5,990,494
- Issue date Nov 23, 1999
- Fuji Xerox Co., Ltd.
- Yasuji Seko
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information Patent Grant
Two-dimensional device array, two-dimensional surface light emittin...
- Patent number 5,978,403
- Issue date Nov 2, 1999
- Fuji Xerox Co., Ltd.
- Izumi Iwasa
- G02 - OPTICS
Information Patent Grant
Image recording apparatus with an array light source
- Patent number 5,963,242
- Issue date Oct 5, 1999
- Fuji Xerox Co., Ltd.
- Hideo Nakayama
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information Patent Grant
Apparatus for correcting positional deviation of light source emitt...
- Patent number 5,880,766
- Issue date Mar 9, 1999
- Fuji Xerox Co., Ltd.
- Akemi Murakami
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor laser array driving method, semiconductor laser array...
- Patent number 5,809,052
- Issue date Sep 15, 1998
- Fuji Xerox Co., Ltd.
- Yasuji Seko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of making a semiconductor laser device
- Patent number 5,648,295
- Issue date Jul 15, 1997
- Fuji Xerox Co., Ltd.
- Hiromi Otoma
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Semiconductor laser device
- Patent number 5,588,016
- Issue date Dec 24, 1996
- Fuji Xerox Co., Ltd.
- Hiromi Otoma
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Semiconductor laser device
- Patent number 5,491,709
- Issue date Feb 13, 1996
- Fuji Xerox Co., Ltd.
- Yasuji Seko
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Multiquantum barrier laser having high electron and hole reflectivi...
- Patent number 5,425,041
- Issue date Jun 13, 1995
- Fuji Xerox Co., Ltd.
- Yasuji Seko
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Semiconductor laser device
- Patent number 5,253,265
- Issue date Oct 12, 1993
- Fuji Xerox Co., Ltd.
- Yasuji Seko
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
POSITION MEASURING TARGET, POSITION MEASUREMENT SYSTEM, CALCULATION...
- Publication number 20110063435
- Publication date Mar 17, 2011
- FUJI XEROX CO., LTD
- YASUJI SEKO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
POSITION MEASUREMENT SYSTEM, POSITION MEASUREMENT METHOD AND COMPUT...
- Publication number 20100231709
- Publication date Sep 16, 2010
- FUJI XEROX CO., LTD
- Yasuji Seko
- G01 - MEASURING TESTING
Information Patent Application
POSITION MEASURING SYSTEM, POSITION MEASURING METHOD AND COMPUTER R...
- Publication number 20100014750
- Publication date Jan 21, 2010
- FUJI XEROX CO., LTD
- Yasuji Seko
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Position measurement system
- Publication number 20090310142
- Publication date Dec 17, 2009
- FUJI XEROX CO., LTD
- Yasuji Seko
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL LENS SYSTEM AND POSTION MEASUREMENT SYSTEM USING THE SAME
- Publication number 20090103104
- Publication date Apr 23, 2009
- FUJI XEROX CO., LTD
- Yasuji Seko
- G02 - OPTICS
Information Patent Application
POSITION MEASUREMENT SYSTEM, POSITION MEASUREMENT METHOD AND COMPUT...
- Publication number 20090070065
- Publication date Mar 12, 2009
- FUJI XEROX CO., LTD
- Yasuji Seko
- G01 - MEASURING TESTING
Information Patent Application
Longitudinal interference fringe pattern projection lens, optical s...
- Publication number 20080112054
- Publication date May 15, 2008
- FUJI XEROX CO., LTD
- Yasuji Seko
- G02 - OPTICS
Information Patent Application
OPTICAL LENS SYSTEM AND POSITION MEASUREMENT SYSTEM USING THE SAME
- Publication number 20070291278
- Publication date Dec 20, 2007
- FUJI XEROX CO., LTD
- Yasuji Seko
- G02 - OPTICS
Information Patent Application
Position measurement system
- Publication number 20070133006
- Publication date Jun 14, 2007
- FUJI XEROX CO., LTD
- Yasuji Seko
- G01 - MEASURING TESTING
Information Patent Application
Position measurement system
- Publication number 20070045420
- Publication date Mar 1, 2007
- FUJI XEROX CO., LTD
- Yasuji Seko
- G01 - MEASURING TESTING
Information Patent Application
Information processing method and system using terminal apparatus
- Publication number 20070001009
- Publication date Jan 4, 2007
- FUJI XEROX CO., LTD
- Hiroyuki Miyake
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Position measurement system
- Publication number 20060215178
- Publication date Sep 28, 2006
- Fuji Xerox co., LTD.
- Yasuji Seko
- G01 - MEASURING TESTING
Information Patent Application
Optical lens system and position measurement system using the same
- Publication number 20050259266
- Publication date Nov 24, 2005
- Fuji Xerox co., LTD.
- Yasuji Seko
- G02 - OPTICS
Information Patent Application
Positional measurement system and lens for positional measurement
- Publication number 20050185195
- Publication date Aug 25, 2005
- Fuji Xerox co., LTD.
- Yasuji Seko
- G01 - MEASURING TESTING
Information Patent Application
Wireless optical system
- Publication number 20050041980
- Publication date Feb 24, 2005
- FUJI XEROX CO., LTD
- Kiichi Ueyanagi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Position measurement system
- Publication number 20040051880
- Publication date Mar 18, 2004
- FUJI XEROX CO., LTD
- Yasuji Seko
- G01 - MEASURING TESTING
Information Patent Application
Position measuring system
- Publication number 20040004723
- Publication date Jan 8, 2004
- FUJI XEROX CO., LTD
- Yasuji Seko
- G06 - COMPUTING CALCULATING COUNTING

Yasuji Seko

Person

Patents Grantslast 30 patents

Position measuring system, position measuring method and computer r...

Longitudinal interference fringe pattern projection lens, optical s...

Position measurement system

Position measurement system, position measurement method and comput...

Optical lens system and position measurement system using the same

Position measurement system

Position measurement system

Positional measurement system and lens for positional measurement

Optical lens system and position measurement system using the same

Position measurement system

Information processing method and system using terminal apparatus

Optical lens system and position measurement system using the same

Optical position measuring system using an interference pattern

Position measurement system

Semiconductor device, surface emitting semiconductor laser and edge...

Surface emitting semiconductor laser

Semiconductor device and image formation apparatus using same

Surface emitting semiconductor laser, its producing method and surf...

Optoelectro transducer array, and light-emitting device array and f...

Two-dimensional device array, two-dimensional surface light emittin...

Image recording apparatus with an array light source

Apparatus for correcting positional deviation of light source emitt...

Semiconductor laser array driving method, semiconductor laser array...

Method of making a semiconductor laser device

Semiconductor laser device

Semiconductor laser device

Multiquantum barrier laser having high electron and hole reflectivi...

Semiconductor laser device

Patents Applicationslast 30 patents

POSITION MEASURING TARGET, POSITION MEASUREMENT SYSTEM, CALCULATION...

POSITION MEASUREMENT SYSTEM, POSITION MEASUREMENT METHOD AND COMPUT...

POSITION MEASURING SYSTEM, POSITION MEASURING METHOD AND COMPUTER R...

Position measurement system

OPTICAL LENS SYSTEM AND POSTION MEASUREMENT SYSTEM USING THE SAME

POSITION MEASUREMENT SYSTEM, POSITION MEASUREMENT METHOD AND COMPUT...

Longitudinal interference fringe pattern projection lens, optical s...

OPTICAL LENS SYSTEM AND POSITION MEASUREMENT SYSTEM USING THE SAME

Position measurement system

Position measurement system

Information processing method and system using terminal apparatus

Position measurement system

Optical lens system and position measurement system using the same

Positional measurement system and lens for positional measurement

Wireless optical system

Position measurement system

Position measuring system